Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis

Brendan Griffin; C.E. Nockolds

Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis

Brendan Griffin, C.E. Nockolds

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Microscopy Society of America 54th Annual Meeting
Editors	G.W. Bailey, J.M. Corbett, R.V.W. Dimlich, J.R. Michael, N.J. Zaluzec
Place of Publication	San Francisco
Publisher	San Francisco Press Inc.
Pages	840-841
Volume	1
Edition	Minnesota
Publication status	Published - 1996
Event	Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis - Minnesota Duration: 1 Jan 1996 → …

Conference

Conference	Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis
Period	1/01/96 → …

Cite this

Griffin, B., & Nockolds, C. E. (1996). Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis. In G. W. Bailey, J. M. Corbett, R. V. W. Dimlich, J. R. Michael, & N. J. Zaluzec (Eds.), Microscopy Society of America 54th Annual Meeting (Minnesota ed., Vol. 1, pp. 840-841). San Francisco Press Inc..

Griffin, Brendan ; Nockolds, C.E. / Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis. Microscopy Society of America 54th Annual Meeting. editor / G.W. Bailey ; J.M. Corbett ; R.V.W. Dimlich ; J.R. Michael ; N.J. Zaluzec. Vol. 1 Minnesota. ed. San Francisco : San Francisco Press Inc., 1996. pp. 840-841

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title = "Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis",

author = "Brendan Griffin and C.E. Nockolds",

year = "1996",

language = "English",

volume = "1",

pages = "840--841",

editor = "G.W. Bailey and J.M. Corbett and R.V.W. Dimlich and J.R. Michael and N.J. Zaluzec",

booktitle = "Microscopy Society of America 54th Annual Meeting",

publisher = "San Francisco Press Inc.",

edition = "Minnesota",

note = "Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis ; Conference date: 01-01-1996",

}

Griffin, B & Nockolds, CE 1996, Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis. in GW Bailey, JM Corbett, RVW Dimlich, JR Michael & NJ Zaluzec (eds), Microscopy Society of America 54th Annual Meeting. Minnesota edn, vol. 1, San Francisco Press Inc., San Francisco, pp. 840-841, Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis, 1/01/96.

Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis. / Griffin, Brendan; Nockolds, C.E.
Microscopy Society of America 54th Annual Meeting. ed. / G.W. Bailey; J.M. Corbett; R.V.W. Dimlich; J.R. Michael; N.J. Zaluzec. Vol. 1 Minnesota. ed. San Francisco: San Francisco Press Inc., 1996. p. 840-841.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis

AU - Griffin, Brendan

AU - Nockolds, C.E.

PY - 1996

Y1 - 1996

M3 - Conference paper

VL - 1

SP - 840

EP - 841

BT - Microscopy Society of America 54th Annual Meeting

A2 - Bailey, G.W.

A2 - Corbett, J.M.

A2 - Dimlich, R.V.W.

A2 - Michael, J.R.

A2 - Zaluzec, N.J.

PB - San Francisco Press Inc.

CY - San Francisco

T2 - Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis

Y2 - 1 January 1996

ER -

Griffin B, Nockolds CE. Environmental scanning electron microscope (ESEM) observation of subsurface charge effects in insulators: Implications for electron imaging and x-ray microanalysis. In Bailey GW, Corbett JM, Dimlich RVW, Michael JR, Zaluzec NJ, editors, Microscopy Society of America 54th Annual Meeting. Minnesota ed. Vol. 1. San Francisco: San Francisco Press Inc. 1996. p. 840-841