Eight dimensions of corporate identity: Evidence from China’s high technology.

Bang Nguyen, TC Melewar, Arnold Japutra, Sung Ho Han

Research output: Contribution to conferenceAbstract

Original languageEnglish
Publication statusPublished - 2014
Event2nd International Colloquium on Design, Branding and Marketing - Nottingham Trent University
Duration: 9 Dec 201410 Dec 2014

Conference

Conference2nd International Colloquium on Design, Branding and Marketing
Period9/12/1410/12/14

Cite this

Nguyen, B., Melewar, TC., Japutra, A., & Han, S. H. (2014). Eight dimensions of corporate identity: Evidence from China’s high technology.. Abstract from 2nd International Colloquium on Design, Branding and Marketing, .
Nguyen, Bang ; Melewar, TC ; Japutra, Arnold ; Han, Sung Ho. / Eight dimensions of corporate identity: Evidence from China’s high technology. Abstract from 2nd International Colloquium on Design, Branding and Marketing, .
@conference{d2e1e3919b404c7bb05e456b341e9729,
title = "Eight dimensions of corporate identity: Evidence from China’s high technology.",
author = "Bang Nguyen and TC Melewar and Arnold Japutra and Han, {Sung Ho}",
year = "2014",
language = "English",
note = "2nd International Colloquium on Design, Branding and Marketing ; Conference date: 09-12-2014 Through 10-12-2014",

}

Nguyen, B, Melewar, TC, Japutra, A & Han, SH 2014, 'Eight dimensions of corporate identity: Evidence from China’s high technology.' 2nd International Colloquium on Design, Branding and Marketing, 9/12/14 - 10/12/14, .

Eight dimensions of corporate identity: Evidence from China’s high technology. / Nguyen, Bang; Melewar, TC; Japutra, Arnold; Han, Sung Ho.

2014. Abstract from 2nd International Colloquium on Design, Branding and Marketing, .

Research output: Contribution to conferenceAbstract

TY - CONF

T1 - Eight dimensions of corporate identity: Evidence from China’s high technology.

AU - Nguyen, Bang

AU - Melewar, TC

AU - Japutra, Arnold

AU - Han, Sung Ho

PY - 2014

Y1 - 2014

M3 - Abstract

ER -

Nguyen B, Melewar TC, Japutra A, Han SH. Eight dimensions of corporate identity: Evidence from China’s high technology.. 2014. Abstract from 2nd International Colloquium on Design, Branding and Marketing, .