Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE

C. Shen; Renjie Gu; X. Fu; W. Wang; Y. Guo; L. Chen; G. Wang; F. Yang; L. He

doi:10.1117/12.900514

Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE

C. Shen, Renjie Gu, X. Fu, W. Wang, Y. Guo, L. Chen, G. Wang, F. Yang, L. He

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications
Place of Publication	Bellingham, Washington, USA
Publisher	SPIE
Pages	81932P-1 - 81932P-7
Volume	8193
ISBN (Print)	0277786X
DOIs	https://doi.org/10.1117/12.900514
Publication status	Published - 2011
Event	Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE - Beijing, China Duration: 1 Jan 2011 → …

Conference

Conference	Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE
Period	1/01/11 → …

Access to Document

10.1117/12.900514

Cite this

Shen, C., Gu, R., Fu, X., Wang, W., Guo, Y., Chen, L., Wang, G., Yang, F., & He, L. (2011). Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE. In Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications (Vol. 8193, pp. 81932P-1 - 81932P-7). SPIE. https://doi.org/10.1117/12.900514

@inproceedings{c67cb65e88064990b229946848ef5c80,

title = "Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE",

author = "C. Shen and Renjie Gu and X. Fu and W. Wang and Y. Guo and L. Chen and G. Wang and F. Yang and L. He",

year = "2011",

doi = "10.1117/12.900514",

language = "English",

isbn = "0277786X",

volume = "8193",

pages = "81932P--1 -- 81932P--7",

booktitle = "Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications",

publisher = "SPIE",

address = "United States",

note = "Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE ; Conference date: 01-01-2011",

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Shen, C, Gu, R, Fu, X, Wang, W, Guo, Y, Chen, L, Wang, G, Yang, F & He, L 2011, Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE. in Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications. vol. 8193, SPIE, Bellingham, Washington, USA, pp. 81932P-1 - 81932P-7, Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE, 1/01/11. https://doi.org/10.1117/12.900514

Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE. / Shen, C.; Gu, Renjie; Fu, X. et al.
Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications. Vol. 8193 Bellingham, Washington, USA: SPIE, 2011. p. 81932P-1 - 81932P-7.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE

AU - Shen, C.

AU - Gu, Renjie

AU - Fu, X.

AU - Wang, W.

AU - Guo, Y.

AU - Chen, L.

AU - Wang, G.

AU - Yang, F.

AU - He, L.

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M3 - Conference paper

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VL - 8193

SP - 81932P-1 - 81932P-7

BT - Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications

PB - SPIE

CY - Bellingham, Washington, USA

T2 - Effects of thermal annealing on HgCdTe/CdTe/Si(211) by MBE

Y2 - 1 January 2011

ER -