Effect of Modelling Fringing and Losses for a Microstrip on the Radiated Emission Characteristics

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Proceedings of the 16th International Zurich Symposium on Electromagnetic Compatibility
Place of Publication	Zurich, Switzerland
Publisher	Swiss Federal Institute of Technology
Pages	557-562
Volume	CD-ROM
Edition	Zurich, Switzerland
ISBN (Print)	3952119997
Publication status	Published - 2005
Event	Effect of Modelling Fringing and Losses for a Microstrip on the Radiated Emission Characteristics - Zurich, Switzerland Duration: 1 Jan 2005 → …

Conference	Effect of Modelling Fringing and Losses for a Microstrip on the Radiated Emission Characteristics
Period	1/01/05 → …

Cite this

@inproceedings{432d1954db12488ea5d3da22eb1e3f11,

title = "Effect of Modelling Fringing and Losses for a Microstrip on the Radiated Emission Characteristics",

author = "B. Wong and Antonio Cantoni and Kevin Fynn and J. Trinkle",

year = "2005",

language = "English",

isbn = "3952119997",

volume = "CD-ROM",

pages = "557--562",

booktitle = "Proceedings of the 16th International Zurich Symposium on Electromagnetic Compatibility",

publisher = "Swiss Federal Institute of Technology",

edition = "Zurich, Switzerland",

note = "Effect of Modelling Fringing and Losses for a Microstrip on the Radiated Emission Characteristics ; Conference date: 01-01-2005",

}

Wong, B, Cantoni, A , Fynn, K & Trinkle, J 2005, Effect of Modelling Fringing and Losses for a Microstrip on the Radiated Emission Characteristics. in Proceedings of the 16th International Zurich Symposium on Electromagnetic Compatibility. Zurich, Switzerland edn, vol. CD-ROM, Swiss Federal Institute of Technology, Zurich, Switzerland, pp. 557-562, Effect of Modelling Fringing and Losses for a Microstrip on the Radiated Emission Characteristics, 1/01/05.

Effect of Modelling Fringing and Losses for a Microstrip on the Radiated Emission Characteristics. / Wong, B.; Cantoni, Antonio ; Fynn, Kevin et al.
Proceedings of the 16th International Zurich Symposium on Electromagnetic Compatibility. Vol. CD-ROM Zurich, Switzerland. ed. Zurich, Switzerland: Swiss Federal Institute of Technology, 2005. p. 557-562.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - Effect of Modelling Fringing and Losses for a Microstrip on the Radiated Emission Characteristics

AU - Wong, B.

AU - Cantoni, Antonio

AU - Fynn, Kevin

AU - Trinkle, J.

PY - 2005

Y1 - 2005

M3 - Conference paper

SN - 3952119997

VL - CD-ROM

SP - 557

EP - 562

BT - Proceedings of the 16th International Zurich Symposium on Electromagnetic Compatibility

PB - Swiss Federal Institute of Technology

CY - Zurich, Switzerland

T2 - Effect of Modelling Fringing and Losses for a Microstrip on the Radiated Emission Characteristics

Y2 - 1 January 2005

ER -