Dynamic breast MRI: Image registration and its impact on enhancement curve estimation

Andrew Hill, Andrew Mehnert, Stuart Crozier, Carlos Leung, Stephen Wilson, Kerry McMahon, Dominic Kennedy

Research output: Chapter in Book/Conference paperConference paper

9 Citations (Scopus)

Abstract

A novel algorithm for performing registration of dynamic contrast-enhanced (DCE) MRI data of the breast is presented. It is based on an algorithm known as iterated dynamic programming originally devised to solve the stereo matching problem. Using artificially distorted DCE-MRI breast images it is shown that the proposed algorithm is able to correct for movement and distortions over a larger range than is likely to occur during routine clinical examination. In addition, using a clinical DCE-MRI data set with an expertly labeled suspicious region, it is shown that the proposed algorithm significantly reduces the variability of the enhancement curves at the pixel level yielding more pronounced uptake and washout phases.

Original languageEnglish
Title of host publication28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages3049-3052
Number of pages4
ISBN (Print)1424400325, 9781424400324
DOIs
Publication statusPublished - 1 Dec 2006
Externally publishedYes
Event28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06 - New York, NY, United States
Duration: 30 Aug 20063 Sep 2006

Conference

Conference28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06
CountryUnited States
CityNew York, NY
Period30/08/063/09/06

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Hill, A., Mehnert, A., Crozier, S., Leung, C., Wilson, S., McMahon, K., & Kennedy, D. (2006). Dynamic breast MRI: Image registration and its impact on enhancement curve estimation. In 28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06 (pp. 3049-3052). [4030026] USA: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IEMBS.2006.259958