Distortion Measurement for Automatic Document Verification

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of the 11th International Conference on Document Analysis and Recognition ICDAR 2011
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	289 - 293
ISBN (Print)	9780769545202
DOIs	https://doi.org/10.1109/ICDAR.2011.66
Publication status	Published - 2011
Event	11th International Conference on Document Analysis and Recognition ICDAR 2011 - Beijing, China Duration: 18 Sept 2011 → 21 Sept 2011

Conference	11th International Conference on Document Analysis and Recognition ICDAR 2011
Country/Territory	China
City	Beijing
Period	18/09/11 → 21/09/11

Access to Document

@inproceedings{df4405fe25cb4dd5991ea2ad78229d6c,

title = "Distortion Measurement for Automatic Document Verification",

author = "{Van Beusekom}, J. and Faisal Shafait",

year = "2011",

doi = "10.1109/ICDAR.2011.66",

language = "English",

isbn = "9780769545202",

pages = "289 -- 293",

booktitle = "Proceedings of the 11th International Conference on Document Analysis and Recognition ICDAR 2011",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

note = "11th International Conference on Document Analysis and Recognition ICDAR 2011 ; Conference date: 18-09-2011 Through 21-09-2011",

}

Van Beusekom, J & Shafait, F 2011, Distortion Measurement for Automatic Document Verification. in Proceedings of the 11th International Conference on Document Analysis and Recognition ICDAR 2011. IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 289 - 293, 11th International Conference on Document Analysis and Recognition ICDAR 2011, Beijing, China, 18/09/11. https://doi.org/10.1109/ICDAR.2011.66

TY - GEN

T1 - Distortion Measurement for Automatic Document Verification

AU - Van Beusekom, J.

AU - Shafait, Faisal

PY - 2011

Y1 - 2011

U2 - 10.1109/ICDAR.2011.66

DO - 10.1109/ICDAR.2011.66

M3 - Conference paper

SN - 9780769545202

SP - 289

EP - 293

BT - Proceedings of the 11th International Conference on Document Analysis and Recognition ICDAR 2011

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - 11th International Conference on Document Analysis and Recognition ICDAR 2011

Y2 - 18 September 2011 through 21 September 2011

ER -