Distance metric learning for pattern recognition

Jiwen Lu, Ruiping Wang, Ajmal Mian, Ajay Kumar, Sudeep Sarkar

    Research output: Contribution to journalEditorial

    LanguageEnglish
    Pages1-3
    Number of pages3
    JournalPattern Recognition
    Volume75
    DOIs
    StatePublished - 1 Mar 2018

    Cite this

    Lu, Jiwen ; Wang, Ruiping ; Mian, Ajmal ; Kumar, Ajay ; Sarkar, Sudeep. / Distance metric learning for pattern recognition. In: Pattern Recognition. 2018 ; Vol. 75. pp. 1-3
    @article{04f4ebff896a428ab86b4107474a465b,
    title = "Distance metric learning for pattern recognition",
    author = "Jiwen Lu and Ruiping Wang and Ajmal Mian and Ajay Kumar and Sudeep Sarkar",
    year = "2018",
    month = "3",
    day = "1",
    doi = "10.1016/j.patcog.2017.10.032",
    language = "English",
    volume = "75",
    pages = "1--3",
    journal = "Pattern Recognition",
    issn = "0031-3203",
    publisher = "Elsevier",

    }

    Lu, J, Wang, R, Mian, A, Kumar, A & Sarkar, S 2018, 'Distance metric learning for pattern recognition' Pattern Recognition, vol 75, pp. 1-3. DOI: 10.1016/j.patcog.2017.10.032

    Distance metric learning for pattern recognition. / Lu, Jiwen; Wang, Ruiping; Mian, Ajmal; Kumar, Ajay; Sarkar, Sudeep.

    In: Pattern Recognition, Vol. 75, 01.03.2018, p. 1-3.

    Research output: Contribution to journalEditorial

    TY - JOUR

    T1 - Distance metric learning for pattern recognition

    AU - Lu,Jiwen

    AU - Wang,Ruiping

    AU - Mian,Ajmal

    AU - Kumar,Ajay

    AU - Sarkar,Sudeep

    PY - 2018/3/1

    Y1 - 2018/3/1

    UR - http://www.scopus.com/inward/record.url?scp=85032733296&partnerID=8YFLogxK

    U2 - 10.1016/j.patcog.2017.10.032

    DO - 10.1016/j.patcog.2017.10.032

    M3 - Editorial

    VL - 75

    SP - 1

    EP - 3

    JO - Pattern Recognition

    T2 - Pattern Recognition

    JF - Pattern Recognition

    SN - 0031-3203

    ER -

    Lu J, Wang R, Mian A, Kumar A, Sarkar S. Distance metric learning for pattern recognition. Pattern Recognition. 2018 Mar 1;75:1-3. Available from, DOI: 10.1016/j.patcog.2017.10.032