Distance metric learning for pattern recognition

Jiwen Lu, Ruiping Wang, Ajmal Mian, Ajay Kumar, Sudeep Sarkar

Research output: Contribution to journal › Editorial › peer-review

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@article{04f4ebff896a428ab86b4107474a465b,

title = "Distance metric learning for pattern recognition",

author = "Jiwen Lu and Ruiping Wang and Ajmal Mian and Ajay Kumar and Sudeep Sarkar",

year = "2018",

month = mar,

day = "1",

doi = "10.1016/j.patcog.2017.10.032",

language = "English",

volume = "75",

pages = "1--3",

journal = "Pattern Recognition",

issn = "0031-3203",

publisher = "Elsevier",

}

TY - JOUR

T1 - Distance metric learning for pattern recognition

AU - Lu, Jiwen

AU - Wang, Ruiping

AU - Mian, Ajmal

AU - Kumar, Ajay

AU - Sarkar, Sudeep

PY - 2018/3/1

Y1 - 2018/3/1

UR - http://www.scopus.com/inward/record.url?scp=85032733296&partnerID=8YFLogxK

U2 - 10.1016/j.patcog.2017.10.032

DO - 10.1016/j.patcog.2017.10.032

M3 - Editorial

AN - SCOPUS:85032733296

SN - 0031-3203

VL - 75

SP - 1

EP - 3

JO - Pattern Recognition

JF - Pattern Recognition

ER -