Direct Three Dimensional Diffraction Pattern Analysis on the Electron Microscope

A. W. S. Johnson, A. D. Antonovsky

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationAustralian Conference on Electron Microscopy
Publication statusPublished - Feb 1988
Externally publishedYes
Event10th Australian Conference on Electron Microscopy - Adelaide, Australia
Duration: 8 Feb 198810 Feb 1988

Conference

Conference10th Australian Conference on Electron Microscopy
CountryAustralia
CityAdelaide
Period8/02/8810/02/88

Cite this

Johnson, A. W. S., & Antonovsky, A. D. (1988). Direct Three Dimensional Diffraction Pattern Analysis on the Electron Microscope. In Australian Conference on Electron Microscopy
Johnson, A. W. S. ; Antonovsky, A. D. / Direct Three Dimensional Diffraction Pattern Analysis on the Electron Microscope. Australian Conference on Electron Microscopy. 1988.
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title = "Direct Three Dimensional Diffraction Pattern Analysis on the Electron Microscope",
author = "Johnson, {A. W. S.} and Antonovsky, {A. D.}",
year = "1988",
month = "2",
language = "English",
booktitle = "Australian Conference on Electron Microscopy",

}

Johnson, AWS & Antonovsky, AD 1988, Direct Three Dimensional Diffraction Pattern Analysis on the Electron Microscope. in Australian Conference on Electron Microscopy. 10th Australian Conference on Electron Microscopy, Adelaide, Australia, 8/02/88.

Direct Three Dimensional Diffraction Pattern Analysis on the Electron Microscope. / Johnson, A. W. S. ; Antonovsky, A. D.

Australian Conference on Electron Microscopy. 1988.

Research output: Chapter in Book/Conference paperConference paper

TY - GEN

T1 - Direct Three Dimensional Diffraction Pattern Analysis on the Electron Microscope

AU - Johnson, A. W. S.

AU - Antonovsky, A. D.

PY - 1988/2

Y1 - 1988/2

M3 - Conference paper

BT - Australian Conference on Electron Microscopy

ER -

Johnson AWS, Antonovsky AD. Direct Three Dimensional Diffraction Pattern Analysis on the Electron Microscope. In Australian Conference on Electron Microscopy. 1988