Direct comparison of atomic force microscopic and total internal reflection microscopic measurements in the presence of nonadsorbing polyelectrolytes

Simon Biggs, Dennis C. Prieve, Raymond R. Dagastine

Research output: Contribution to journalArticle

49 Citations (Scopus)

Abstract

We have investigated the structural and depletion forces between silica glass surfaces in aqueous, salt-free solutions of sodium poly(styrene sulfonate). The interaction forces were investigated by two techniques: total internal reflectance microscopy (TIRM) and colloid probe atomic force microscopy (AFM). The TIRM technique measures the potential energy of interaction directly, while the AFM is a force balance. Comparison between the data sets was used to independently calibrate the AFM data since the separation distances cannot be unequivocally determined by this technique. Oscillatory structural forces are excellent for this work since they give multiple reference points against which to analyze. Comparison of the data from the two techniques highlighted significant uncertainties in the AFM data. At low polymer concentrations, a significant uncertainty in the apparent zero separation distance was seen as a result of the AFM cantilever reaching an apparent constant compliance region prior to any real contact between the surfaces. Further complications arising from the number and position of the measured minima were also seen in the dilute polymer concentration regime as a result of hydrodynamic drainage between the approaching surfaces in the AFM perturbing the delicate structural components in the fluid.

Original languageEnglish
Pages (from-to)5421-5428
Number of pages8
JournalLangmuir
Volume21
Issue number12
DOIs
Publication statusPublished - 7 Jun 2005
Externally publishedYes

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