Diffusion length measurements using laser beam induced current

D.A. Redfern; J.A. Thomas; Charles Musca; John Dell; Lorenzo Faraone

Diffusion length measurements using laser beam induced current

D.A. Redfern, J.A. Thomas, Charles Musca, John Dell, Lorenzo Faraone

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)
Editors	Leonard D. Broekman, Brian F. Usher, John D. Riley
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	463-466
Volume	1
Edition	La Trobe University, Melbourne
ISBN (Print)	0780366980
Publication status	Published - 2002
Event	Diffusion length measurements using laser beam induced current - La Trobe University, Melbourne Duration: 1 Jan 2002 → …

Conference

Conference	Diffusion length measurements using laser beam induced current
Period	1/01/02 → …

Cite this

Redfern, D. A., Thomas, J. A., Musca, C., Dell, J., & Faraone, L. (2002). Diffusion length measurements using laser beam induced current. In L. D. Broekman, B. F. Usher, & J. D. Riley (Eds.), Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000) (La Trobe University, Melbourne ed., Vol. 1, pp. 463-466). IEEE, Institute of Electrical and Electronics Engineers.

Redfern, D.A. ; Thomas, J.A. ; Musca, Charles et al. / Diffusion length measurements using laser beam induced current. Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). editor / Leonard D. Broekman ; Brian F. Usher ; John D. Riley. Vol. 1 La Trobe University, Melbourne. ed. USA : IEEE, Institute of Electrical and Electronics Engineers, 2002. pp. 463-466

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title = "Diffusion length measurements using laser beam induced current",

author = "D.A. Redfern and J.A. Thomas and Charles Musca and John Dell and Lorenzo Faraone",

year = "2002",

language = "English",

isbn = "0780366980",

volume = "1",

pages = "463--466",

editor = "Broekman, \{Leonard D.\} and Usher, \{Brian F.\} and Riley, \{John D.\}",

booktitle = "Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "La Trobe University, Melbourne",

note = "Diffusion length measurements using laser beam induced current ; Conference date: 01-01-2002",

}

Redfern, DA, Thomas, JA, Musca, C, Dell, J & Faraone, L 2002, Diffusion length measurements using laser beam induced current. in LD Broekman, BF Usher & JD Riley (eds), Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). La Trobe University, Melbourne edn, vol. 1, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 463-466, Diffusion length measurements using laser beam induced current, 1/01/02.

Diffusion length measurements using laser beam induced current. / Redfern, D.A.; Thomas, J.A.; Musca, Charles et al.
Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). ed. / Leonard D. Broekman; Brian F. Usher; John D. Riley. Vol. 1 La Trobe University, Melbourne. ed. USA: IEEE, Institute of Electrical and Electronics Engineers, 2002. p. 463-466.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Diffusion length measurements using laser beam induced current

AU - Redfern, D.A.

AU - Thomas, J.A.

AU - Musca, Charles

AU - Dell, John

AU - Faraone, Lorenzo

PY - 2002

Y1 - 2002

M3 - Conference paper

SN - 0780366980

VL - 1

SP - 463

EP - 466

BT - Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)

A2 - Broekman, Leonard D.

A2 - Usher, Brian F.

A2 - Riley, John D.

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - Diffusion length measurements using laser beam induced current

Y2 - 1 January 2002

ER -

Redfern DA, Thomas JA, Musca C, Dell J , Faraone L. Diffusion length measurements using laser beam induced current. In Broekman LD, Usher BF, Riley JD, editors, Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). La Trobe University, Melbourne ed. Vol. 1. USA: IEEE, Institute of Electrical and Electronics Engineers. 2002. p. 463-466