Diffusion length measurements using laser beam induced current

D.A. Redfern, J.A. Thomas, Charles Musca, John Dell, Lorenzo Faraone

Research output: Chapter in Book/Conference paperConference paperpeer-review

Original languageEnglish
Title of host publicationProceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)
EditorsLeonard D. Broekman, Brian F. Usher, John D. Riley
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages463-466
Volume1
EditionLa Trobe University, Melbourne
ISBN (Print)0780366980
Publication statusPublished - 2002
EventDiffusion length measurements using laser beam induced current - La Trobe University, Melbourne
Duration: 1 Jan 2002 → …

Conference

ConferenceDiffusion length measurements using laser beam induced current
Period1/01/02 → …

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