Different properties of SV channels in root vacuoles from near isogenic Al-tolerant and Al-sensitive wheat cultivars

Tim Wherrett, Sergey Shabala, Igor Pottosin

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

Patch-clamp experiments revealed that near isogenic ET8 (Al-tolerant) and ES8 (Al-sensitive) wheat cultivars differed significantly in slow vacuolar channel properties. Under control conditions, whole vacuole currents displayed faster deactivation in ES8. Application of 1.4 μM vacuolar Al3+ caused a 20 mV increase in the activation threshold and slowed activation kinetics in ET8 but not in ES8. Channel density was about 30% higher in ES8 than ET8, and was not altered by 24 h aluminium pre-treatment. However, the activation threshold was reduced in Al-pre-treated ES8. Overall, our data suggests that Alt1 locus may control more than the plasma membrane malate channel in wheat.

Original languageEnglish
Pages (from-to)6890-6894
Number of pages5
JournalFEBS Letters
Volume579
Issue number30
DOIs
Publication statusPublished - 19 Dec 2005
Externally publishedYes

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