Abstract
Patch-clamp experiments revealed that near isogenic ET8 (Al-tolerant) and ES8 (Al-sensitive) wheat cultivars differed significantly in slow vacuolar channel properties. Under control conditions, whole vacuole currents displayed faster deactivation in ES8. Application of 1.4 μM vacuolar Al3+ caused a 20 mV increase in the activation threshold and slowed activation kinetics in ET8 but not in ES8. Channel density was about 30% higher in ES8 than ET8, and was not altered by 24 h aluminium pre-treatment. However, the activation threshold was reduced in Al-pre-treated ES8. Overall, our data suggests that Alt1 locus may control more than the plasma membrane malate channel in wheat.
Original language | English |
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Pages (from-to) | 6890-6894 |
Number of pages | 5 |
Journal | FEBS Letters |
Volume | 579 |
Issue number | 30 |
DOIs | |
Publication status | Published - 19 Dec 2005 |
Externally published | Yes |