Determining intrinsic stress and strain state of fibre-textured thin films by x-ray diffraction measurements using combined asymmetrical and Bragg-Brentano configurations

Research output: Contribution to journalArticle

Abstract

Measuring intrinsic macro stresses in fibre-textured thin films have always been challenging. Due to the nature of preferential orientation in these films, only d-spacings aligned with the film surface are observable in Bragg-Brentano X-ray diffraction scans, and to collect sufficient diffraction data needed for the stress calculation, a sample stage with tilt capabilities is essentially required. In this article, a new method is developed to lift this requirement. Based on the thin film crystal structure, an incident angle for asymmetrical XRD configuration is calculated to reveal tilted planes belonging to the same group of crystallites which are the textured majority. Measurement of d-spacing for this angle of incidence in combination with the Bragg-Brentano configuration is shown to successfully extract stress-free lattice parameter and the internal stress of the cubic metallic thin film. This method can also be adapted to determine stress and strain in polycrystalline thin films.

Original languageEnglish
Article number108063
JournalMaterials and Design
Volume181
DOIs
Publication statusPublished - 5 Nov 2019

Fingerprint

Diffraction
X rays
Thin films
Fibers
Metallic films
Crystallites
Lattice constants
Macros
Residual stresses
Crystal structure
X ray diffraction

Cite this

@article{cb91ef7ab97a442fb821eebf9828560b,
title = "Determining intrinsic stress and strain state of fibre-textured thin films by x-ray diffraction measurements using combined asymmetrical and Bragg-Brentano configurations",
abstract = "Measuring intrinsic macro stresses in fibre-textured thin films have always been challenging. Due to the nature of preferential orientation in these films, only d-spacings aligned with the film surface are observable in Bragg-Brentano X-ray diffraction scans, and to collect sufficient diffraction data needed for the stress calculation, a sample stage with tilt capabilities is essentially required. In this article, a new method is developed to lift this requirement. Based on the thin film crystal structure, an incident angle for asymmetrical XRD configuration is calculated to reveal tilted planes belonging to the same group of crystallites which are the textured majority. Measurement of d-spacing for this angle of incidence in combination with the Bragg-Brentano configuration is shown to successfully extract stress-free lattice parameter and the internal stress of the cubic metallic thin film. This method can also be adapted to determine stress and strain in polycrystalline thin films.",
keywords = "Crystalline texture, Elastic strain, Internal stress, Thin film, X-ray diffraction",
author = "Fakhrodin Motazedian and Zhigang Wu and Junsong Zhang and {Samsam Shariat}, Bashir and Daqiang Jiang and Mariusz Martyniuk and Yinong Liu and Hong Yang",
year = "2019",
month = "11",
day = "5",
doi = "10.1016/j.matdes.2019.108063",
language = "English",
volume = "181",
journal = "MATERIALS & DESIGN",
issn = "0264-1275",
publisher = "Elsevier",

}

TY - JOUR

T1 - Determining intrinsic stress and strain state of fibre-textured thin films by x-ray diffraction measurements using combined asymmetrical and Bragg-Brentano configurations

AU - Motazedian, Fakhrodin

AU - Wu, Zhigang

AU - Zhang, Junsong

AU - Samsam Shariat, Bashir

AU - Jiang, Daqiang

AU - Martyniuk, Mariusz

AU - Liu, Yinong

AU - Yang, Hong

PY - 2019/11/5

Y1 - 2019/11/5

N2 - Measuring intrinsic macro stresses in fibre-textured thin films have always been challenging. Due to the nature of preferential orientation in these films, only d-spacings aligned with the film surface are observable in Bragg-Brentano X-ray diffraction scans, and to collect sufficient diffraction data needed for the stress calculation, a sample stage with tilt capabilities is essentially required. In this article, a new method is developed to lift this requirement. Based on the thin film crystal structure, an incident angle for asymmetrical XRD configuration is calculated to reveal tilted planes belonging to the same group of crystallites which are the textured majority. Measurement of d-spacing for this angle of incidence in combination with the Bragg-Brentano configuration is shown to successfully extract stress-free lattice parameter and the internal stress of the cubic metallic thin film. This method can also be adapted to determine stress and strain in polycrystalline thin films.

AB - Measuring intrinsic macro stresses in fibre-textured thin films have always been challenging. Due to the nature of preferential orientation in these films, only d-spacings aligned with the film surface are observable in Bragg-Brentano X-ray diffraction scans, and to collect sufficient diffraction data needed for the stress calculation, a sample stage with tilt capabilities is essentially required. In this article, a new method is developed to lift this requirement. Based on the thin film crystal structure, an incident angle for asymmetrical XRD configuration is calculated to reveal tilted planes belonging to the same group of crystallites which are the textured majority. Measurement of d-spacing for this angle of incidence in combination with the Bragg-Brentano configuration is shown to successfully extract stress-free lattice parameter and the internal stress of the cubic metallic thin film. This method can also be adapted to determine stress and strain in polycrystalline thin films.

KW - Crystalline texture

KW - Elastic strain

KW - Internal stress

KW - Thin film

KW - X-ray diffraction

UR - http://www.scopus.com/inward/record.url?scp=85069877505&partnerID=8YFLogxK

U2 - 10.1016/j.matdes.2019.108063

DO - 10.1016/j.matdes.2019.108063

M3 - Article

VL - 181

JO - MATERIALS & DESIGN

JF - MATERIALS & DESIGN

SN - 0264-1275

M1 - 108063

ER -