Determination of diffusion length of p-type GaN from spectral-response measurements

D. Wee; Giacinta Parish; Brett Nener

Determination of diffusion length of p-type GaN from spectral-response measurements

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices
Editors	Lorenzo Faraone, Sabine Betts, John Dell, Charles Musca, Brett Nener, Gia Parish, Justin Wehner
Place of Publication	United States of America
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	264-267
Volume	CD Rom
Edition	Perth, Western Australia
ISBN (Print)	1424405785
Publication status	Published - 2007
Event	Determination of diffusion length of p-type GaN from spectral-response measurements - Perth, Western Australia Duration: 1 Jan 2007 → …

Conference

Conference	Determination of diffusion length of p-type GaN from spectral-response measurements
Period	1/01/07 → …

Cite this

Wee, D., Parish, G., & Nener, B. (2007). Determination of diffusion length of p-type GaN from spectral-response measurements. In L. Faraone, S. Betts, J. Dell, C. Musca, B. Nener, G. Parish, & J. Wehner (Eds.), COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices (Perth, Western Australia ed., Vol. CD Rom, pp. 264-267). IEEE, Institute of Electrical and Electronics Engineers.

Wee, D. ; Parish, Giacinta ; Nener, Brett. / Determination of diffusion length of p-type GaN from spectral-response measurements. COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices. editor / Lorenzo Faraone ; Sabine Betts ; John Dell ; Charles Musca ; Brett Nener ; Gia Parish ; Justin Wehner. Vol. CD Rom Perth, Western Australia. ed. United States of America : IEEE, Institute of Electrical and Electronics Engineers, 2007. pp. 264-267

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title = "Determination of diffusion length of p-type GaN from spectral-response measurements",

author = "D. Wee and Giacinta Parish and Brett Nener",

year = "2007",

language = "English",

isbn = "1424405785",

volume = "CD Rom",

pages = "264--267",

editor = "Lorenzo Faraone and Sabine Betts and John Dell and Charles Musca and Brett Nener and Gia Parish and Justin Wehner",

booktitle = "COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "Perth, Western Australia",

note = "Determination of diffusion length of p-type GaN from spectral-response measurements ; Conference date: 01-01-2007",

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Wee, D, Parish, G & Nener, B 2007, Determination of diffusion length of p-type GaN from spectral-response measurements. in L Faraone, S Betts, J Dell, C Musca, B Nener, G Parish & J Wehner (eds), COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices. Perth, Western Australia edn, vol. CD Rom, IEEE, Institute of Electrical and Electronics Engineers, United States of America, pp. 264-267, Determination of diffusion length of p-type GaN from spectral-response measurements, 1/01/07.

Determination of diffusion length of p-type GaN from spectral-response measurements. / Wee, D.; Parish, Giacinta ; Nener, Brett.
COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices. ed. / Lorenzo Faraone; Sabine Betts; John Dell; Charles Musca; Brett Nener; Gia Parish; Justin Wehner. Vol. CD Rom Perth, Western Australia. ed. United States of America: IEEE, Institute of Electrical and Electronics Engineers, 2007. p. 264-267.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Determination of diffusion length of p-type GaN from spectral-response measurements

AU - Wee, D.

AU - Parish, Giacinta

AU - Nener, Brett

PY - 2007

Y1 - 2007

M3 - Conference paper

SN - 1424405785

VL - CD Rom

SP - 264

EP - 267

BT - COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices

A2 - Faraone, Lorenzo

A2 - Betts, Sabine

A2 - Dell, John

A2 - Musca, Charles

A2 - Nener, Brett

A2 - Parish, Gia

A2 - Wehner, Justin

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - United States of America

T2 - Determination of diffusion length of p-type GaN from spectral-response measurements

Y2 - 1 January 2007

ER -

Wee D, Parish G , Nener B. Determination of diffusion length of p-type GaN from spectral-response measurements. In Faraone L, Betts S, Dell J, Musca C, Nener B, Parish G, Wehner J, editors, COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices. Perth, Western Australia ed. Vol. CD Rom. United States of America: IEEE, Institute of Electrical and Electronics Engineers. 2007. p. 264-267