TY - JOUR
T1 - Design and characterization of Fabry-Pérot MEMS-based short-wave infrared microspectrometers
AU - Keating, Adrian
AU - Antoszewski, Jarek
AU - Silva, Dilusha
AU - Winchester, K.J.
AU - Nguyen, Thuyen
AU - Dell, John
AU - Musca, Charles
AU - Faraone, Lorenzo
AU - Mitra, P.
AU - Beck, J.D.
AU - Skokan, M.R.
AU - Robinson, Julia
AU - Silva, KKMBD
PY - 2008
Y1 - 2008
N2 - Microspectrometers based on the monolithic integration of a microelectromechanical system (MEMS) Fabry-Perot filter and a Hg Cd-x(1-x) Te-based infrared detector are discussed and measured results presented. The microspectrometers are designed to operate in the 1.5 mu m to 2.6 mu m wavelength range. Design equations are presented which account for the mechanical and optical characteristics of the device. Measurements indicate linewidths as narrow as 55 nm, switching times of 40 mu s, and a tuning range of 380 nm, which is limited by snap-down. Optical characterization of the distributed Bragg mirrors and the Fabry-Perot filter are presented, and these are shown to be in good agreement with simple first-order analytical models. Bowing of the movable Fabry-Perot mirror due to stress gradients is identified as the dominant source of linewidth broadening.
AB - Microspectrometers based on the monolithic integration of a microelectromechanical system (MEMS) Fabry-Perot filter and a Hg Cd-x(1-x) Te-based infrared detector are discussed and measured results presented. The microspectrometers are designed to operate in the 1.5 mu m to 2.6 mu m wavelength range. Design equations are presented which account for the mechanical and optical characteristics of the device. Measurements indicate linewidths as narrow as 55 nm, switching times of 40 mu s, and a tuning range of 380 nm, which is limited by snap-down. Optical characterization of the distributed Bragg mirrors and the Fabry-Perot filter are presented, and these are shown to be in good agreement with simple first-order analytical models. Bowing of the movable Fabry-Perot mirror due to stress gradients is identified as the dominant source of linewidth broadening.
U2 - 10.1007/s11664-008-0526-0
DO - 10.1007/s11664-008-0526-0
M3 - Article
SN - 0361-5235
VL - 37
SP - 1811
EP - 1820
JO - Journal of Electronic Materials
JF - Journal of Electronic Materials
IS - 12
ER -