Abstract
Extremely high short-term frequency stability has been realized in microwave oscillators based on liquid-helium-cooled sapphire dielectric resonators with a modified mounting structure. These oscillators have exhibited an Allan deviation of about 5.4 X 10(-16)tau (-1/2) for integration times (tau) of 1 to 4 s and a minimum of 2.4 x 10(-16) at 32 s. For integration times longer than 100 s, the frequency stability is approximately 3 x 10(-17)tau (1/2) and the relative drift per day is about 10(-13) This stability is the best reported to date for any microwave source over integration times less than 100 s.
Original language | English |
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Pages (from-to) | 519-521 |
Journal | IEEE Transactions on Instrumentation and Measurement |
Volume | 50 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2001 |