Cryogenic Sapphire Oscillator with Exceptionally High Frequency Stability

Anthony Mann; S. Chang; Andre Luiten

doi:10.1109/19.918181

Cryogenic Sapphire Oscillator with Exceptionally High Frequency Stability

Anthony Mann, S. Chang, Andre Luiten

Graduate Research School

Research output: Contribution to journal › Article

42 Citations (Scopus)

Abstract

Extremely high short-term frequency stability has been realized in microwave oscillators based on liquid-helium-cooled sapphire dielectric resonators with a modified mounting structure. These oscillators have exhibited an Allan deviation of about 5.4 X 10(-16)tau (-1/2) for integration times (tau) of 1 to 4 s and a minimum of 2.4 x 10(-16) at 32 s. For integration times longer than 100 s, the frequency stability is approximately 3 x 10(-17)tau (1/2) and the relative drift per day is about 10(-13) This stability is the best reported to date for any microwave source over integration times less than 100 s.

Original language	English
Pages (from-to)	519-521
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	50
Issue number	2
DOIs	https://doi.org/10.1109/19.918181
Publication status	Published - 2001

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title = "Cryogenic Sapphire Oscillator with Exceptionally High Frequency Stability",

abstract = "Extremely high short-term frequency stability has been realized in microwave oscillators based on liquid-helium-cooled sapphire dielectric resonators with a modified mounting structure. These oscillators have exhibited an Allan deviation of about 5.4 X 10(-16)tau (-1/2) for integration times (tau) of 1 to 4 s and a minimum of 2.4 x 10(-16) at 32 s. For integration times longer than 100 s, the frequency stability is approximately 3 x 10(-17)tau (1/2) and the relative drift per day is about 10(-13) This stability is the best reported to date for any microwave source over integration times less than 100 s.",

author = "Anthony Mann and S. Chang and Andre Luiten",

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AB - Extremely high short-term frequency stability has been realized in microwave oscillators based on liquid-helium-cooled sapphire dielectric resonators with a modified mounting structure. These oscillators have exhibited an Allan deviation of about 5.4 X 10(-16)tau (-1/2) for integration times (tau) of 1 to 4 s and a minimum of 2.4 x 10(-16) at 32 s. For integration times longer than 100 s, the frequency stability is approximately 3 x 10(-17)tau (1/2) and the relative drift per day is about 10(-13) This stability is the best reported to date for any microwave source over integration times less than 100 s.

U2 - 10.1109/19.918181

DO - 10.1109/19.918181

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VL - 50

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JO - Institute of Electrical and Electronics Engineers Transactions on Instrumentation and Measurement

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