Cryogenic Sapphire Oscillator with Exceptionally High Frequency Stability

Anthony Mann, S. Chang, Andre Luiten

Research output: Contribution to journalArticle

42 Citations (Scopus)

Abstract

Extremely high short-term frequency stability has been realized in microwave oscillators based on liquid-helium-cooled sapphire dielectric resonators with a modified mounting structure. These oscillators have exhibited an Allan deviation of about 5.4 X 10(-16)tau (-1/2) for integration times (tau) of 1 to 4 s and a minimum of 2.4 x 10(-16) at 32 s. For integration times longer than 100 s, the frequency stability is approximately 3 x 10(-17)tau (1/2) and the relative drift per day is about 10(-13) This stability is the best reported to date for any microwave source over integration times less than 100 s.
Original languageEnglish
Pages (from-to)519-521
JournalIEEE Transactions on Instrumentation and Measurement
Volume50
Issue number2
DOIs
Publication statusPublished - 2001

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