Correlation of X-ray Photoelectron Spectroscopy and Rutherford Backscattering Soectroscopy Depth Profiles on Hg1-xCdxTe Native Oxides

G.H. Winton, Lorenzo Faraone, R. Lamb

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)35-43
JournalJournal of Vacuum Science and Technology Part A: International Journal Devoted to Vacuum, Surfaces, and Films
VolumeA.12
Issue number12
Publication statusPublished - 1994

Cite this

@article{2975a457602f48d8829f1e7734f6f2a7,
title = "Correlation of X-ray Photoelectron Spectroscopy and Rutherford Backscattering Soectroscopy Depth Profiles on Hg1-xCdxTe Native Oxides",
author = "G.H. Winton and Lorenzo Faraone and R. Lamb",
year = "1994",
language = "English",
volume = "A.12",
pages = "35--43",
journal = "Journal of Vacuum Science and Technology A",
issn = "0734-2101",
publisher = "AVS Science and Technology Society",
number = "12",

}

TY - JOUR

T1 - Correlation of X-ray Photoelectron Spectroscopy and Rutherford Backscattering Soectroscopy Depth Profiles on Hg1-xCdxTe Native Oxides

AU - Winton, G.H.

AU - Faraone, Lorenzo

AU - Lamb, R.

PY - 1994

Y1 - 1994

M3 - Article

VL - A.12

SP - 35

EP - 43

JO - Journal of Vacuum Science and Technology A

JF - Journal of Vacuum Science and Technology A

SN - 0734-2101

IS - 12

ER -