Correlation of Pseudo-MOS transistor and Hall effect measurements in thin SOI wafers

Q-T. Nguyen, Jarek Antoszewski, Lorenzo Faraone, N. Bresson, P. Gentil, S. Cristoloveanu

    Research output: Chapter in Book/Conference paperConference paper

    Original languageEnglish
    Title of host publicationCOMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices
    EditorsLorenzo Faraone, Sabine Betts, John Dell, Charles Musca, Brett Nener, Gia Parish, Justin Wehner
    Place of PublicationUnited States of America
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages39-40
    VolumeCD Rom
    EditionPerth, Western Australia
    ISBN (Print)1424405785
    Publication statusPublished - 2007
    EventCorrelation of Pseudo-MOS transistor and Hall effect measurements in thin SOI wafers - Perth, Western Australia
    Duration: 1 Jan 2007 → …

    Conference

    ConferenceCorrelation of Pseudo-MOS transistor and Hall effect measurements in thin SOI wafers
    Period1/01/07 → …

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