Original language | English |
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Title of host publication | Proc. SPIE 4550, Image Extraction, Segmentation, and Recognition |
Place of Publication | USA |
Publisher | SPIE |
Pages | 319-323 |
Volume | 4550 |
DOIs | |
Publication status | Published - 2001 |
Event | Corner detection method based on wavelet transform - Wuhan, China Duration: 1 Jan 2001 → … |
Conference
Conference | Corner detection method based on wavelet transform |
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Period | 1/01/01 → … |