Contractive Rectifier Networks for Nonlinear Maximum Margin Classification

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	2015 IEEE International Conference on Computer Vision (ICCV)
Place of Publication	Chile
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	2515-2523
ISBN (Print)	15505499
DOIs	https://doi.org/10.1109/ICCV.2015.289
Publication status	Published - 2015
Event	2015 IEEE International Conference on Computer Vision (ICCV) - Santiago, Chile Duration: 7 Dec 2015 → 13 Dec 2015

Conference	2015 IEEE International Conference on Computer Vision (ICCV)
Country/Territory	Chile
City	Santiago
Period	7/12/15 → 13/12/15

Access to Document

@inproceedings{a31d7ef32485423cb48411e4bfd40c85,

title = "Contractive Rectifier Networks for Nonlinear Maximum Margin Classification",

author = "Senjian An and M. Hayat and S.H. Khan and Mohammed Bennamoun and Farid Boussaid and Ferdous Sohel",

year = "2015",

doi = "10.1109/ICCV.2015.289",

language = "English",

isbn = "15505499",

pages = "2515--2523",

booktitle = "2015 IEEE International Conference on Computer Vision (ICCV)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2015 IEEE International Conference on Computer Vision (ICCV) ; Conference date: 07-12-2015 Through 13-12-2015",

}

An, S, Hayat, M, Khan, SH, Bennamoun, M , Boussaid, F & Sohel, F 2015, Contractive Rectifier Networks for Nonlinear Maximum Margin Classification. in 2015 IEEE International Conference on Computer Vision (ICCV). IEEE, Institute of Electrical and Electronics Engineers, Chile, pp. 2515-2523, 2015 IEEE International Conference on Computer Vision (ICCV), Santiago, Chile, 7/12/15. https://doi.org/10.1109/ICCV.2015.289

TY - GEN

T1 - Contractive Rectifier Networks for Nonlinear Maximum Margin Classification

AU - An, Senjian

AU - Hayat, M.

AU - Khan, S.H.

AU - Bennamoun, Mohammed

AU - Boussaid, Farid

AU - Sohel, Ferdous

PY - 2015

Y1 - 2015

U2 - 10.1109/ICCV.2015.289

DO - 10.1109/ICCV.2015.289

M3 - Conference paper

SN - 15505499

SP - 2515

EP - 2523

BT - 2015 IEEE International Conference on Computer Vision (ICCV)

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Chile

T2 - 2015 IEEE International Conference on Computer Vision (ICCV)

Y2 - 7 December 2015 through 13 December 2015

ER -