Comparison of interfaces for (Ba,Sr)TiO3 films deposited on Si and SiO2/Si substrates

Chemistry

• Electron Microscopy 50%
• Oxidation Reaction 50%
• Ion 50%
• Conductance 50%
• Reduction 50%
• Voltage 50%
• Capacitor 50%
• Ellipsometry 50%
• Interface Trap 50%
• Trap Density Measurement 50%

Physics

• High Resolution 50%
• Ion 50%
• Thin Films 50%
• Electric Potential 50%
• Oxidation 50%
• Electron Microscopy 50%
• Capacitance 50%
• Ellipsometry 50%
• Capacitors 50%

Material Science

• Sputter Deposition 100%
• Thin Films 50%
• Metallization 50%
• Microscopy 50%