Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM)

D. Drouin, V. Aimez, X. Hugon, Brendan Griffin, J. Beauvais, J. Beerens

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationSecond Conference of the International Union of Microbeam Analysis Societies
EditorsD.B. Williams, R. Shimizu
Place of PublicationUK
PublisherInstitute of Physics Publishing
Pages271-272
Volumenone
EditionKailua-Kona, Hawaii
ISBN (Print)0 7503 0685 8
Publication statusPublished - 2000
EventCombined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM) - Kailua-Kona, Hawaii
Duration: 1 Jan 2000 → …

Conference

ConferenceCombined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM)
Period1/01/00 → …

Cite this

Drouin, D., Aimez, V., Hugon, X., Griffin, B., Beauvais, J., & Beerens, J. (2000). Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM). In D. B. Williams, & R. Shimizu (Eds.), Second Conference of the International Union of Microbeam Analysis Societies (Kailua-Kona, Hawaii ed., Vol. none, pp. 271-272). Institute of Physics Publishing.