Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM)

D. Drouin; V. Aimez; X. Hugon; Brendan Griffin; J. Beauvais; J. Beerens

Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM)

D. Drouin, V. Aimez, X. Hugon, Brendan Griffin, J. Beauvais, J. Beerens

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Second Conference of the International Union of Microbeam Analysis Societies
Editors	D.B. Williams, R. Shimizu
Place of Publication	UK
Publisher	Institute of Physics Publishing
Pages	271-272
Volume	none
Edition	Kailua-Kona, Hawaii
ISBN (Print)	0 7503 0685 8
Publication status	Published - 2000
Event	Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM) - Kailua-Kona, Hawaii Duration: 1 Jan 2000 → …

Conference

Conference	Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM)
Period	1/01/00 → …

Cite this

Drouin, D., Aimez, V., Hugon, X., Griffin, B., Beauvais, J., & Beerens, J. (2000). Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM). In D. B. Williams, & R. Shimizu (Eds.), Second Conference of the International Union of Microbeam Analysis Societies (Kailua-Kona, Hawaii ed., Vol. none, pp. 271-272). Institute of Physics Publishing.

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title = "Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM)",

author = "D. Drouin and V. Aimez and X. Hugon and Brendan Griffin and J. Beauvais and J. Beerens",

year = "2000",

language = "English",

isbn = "0 7503 0685 8",

volume = "none",

pages = "271--272",

editor = "D.B. Williams and R. Shimizu",

booktitle = "Second Conference of the International Union of Microbeam Analysis Societies",

publisher = "Institute of Physics Publishing",

address = "United States",

edition = "Kailua-Kona, Hawaii",

note = "Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM) ; Conference date: 01-01-2000",

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Drouin, D, Aimez, V, Hugon, X, Griffin, B, Beauvais, J & Beerens, J 2000, Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM). in DB Williams & R Shimizu (eds), Second Conference of the International Union of Microbeam Analysis Societies. Kailua-Kona, Hawaii edn, vol. none, Institute of Physics Publishing, UK, pp. 271-272, Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM), 1/01/00.

Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM). / Drouin, D.; Aimez, V.; Hugon, X. et al.
Second Conference of the International Union of Microbeam Analysis Societies. ed. / D.B. Williams; R. Shimizu. Vol. none Kailua-Kona, Hawaii. ed. UK: Institute of Physics Publishing, 2000. p. 271-272.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM)

AU - Drouin, D.

AU - Aimez, V.

AU - Hugon, X.

AU - Griffin, Brendan

AU - Beauvais, J.

AU - Beerens, J.

PY - 2000

Y1 - 2000

M3 - Conference paper

SN - 0 7503 0685 8

VL - none

SP - 271

EP - 272

BT - Second Conference of the International Union of Microbeam Analysis Societies

A2 - Williams, D.B.

A2 - Shimizu, R.

PB - Institute of Physics Publishing

CY - UK

T2 - Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM)

Y2 - 1 January 2000

ER -

Drouin D, Aimez V, Hugon X, Griffin B, Beauvais J, Beerens J. Combined secondary and backscattered electron detector for Variable Pressure Scanning Electron Microscopes (VPSEM). In Williams DB, Shimizu R, editors, Second Conference of the International Union of Microbeam Analysis Societies. Kailua-Kona, Hawaii ed. Vol. none. UK: Institute of Physics Publishing. 2000. p. 271-272