Charge Contrast imaging and X-Ray Microanalysis in Variable Pressure SEM- Benefits and Limitations

Brendan Griffin

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	21st New Zealand Conference on Microscopy
Editors	Not Available
Place of Publication	Not available
Publisher	Not Available
Pages	L14-L15
Volume	Not available
Edition	Wellington, New Zealand
Publication status	Published - 2003
Event	Charge Contrast imaging and X-Ray Microanalysis in Variable Pressure SEM- Benefits and Limitations - Wellington, New Zealand Duration: 1 Jan 2003 → …

Conference	Charge Contrast imaging and X-Ray Microanalysis in Variable Pressure SEM- Benefits and Limitations
Period	1/01/03 → …

Cite this

@inproceedings{3fa9bd2fa15d414faa36e9be173c2147,

title = "Charge Contrast imaging and X-Ray Microanalysis in Variable Pressure SEM- Benefits and Limitations",

author = "Brendan Griffin",

year = "2003",

language = "English",

volume = "Not available",

pages = "L14--L15",

editor = "Not Available",

booktitle = "21st New Zealand Conference on Microscopy",

publisher = "Not Available",

edition = "Wellington, New Zealand",

note = "Charge Contrast imaging and X-Ray Microanalysis in Variable Pressure SEM- Benefits and Limitations ; Conference date: 01-01-2003",

}

Griffin, B 2003, Charge Contrast imaging and X-Ray Microanalysis in Variable Pressure SEM- Benefits and Limitations. in N Available (ed.), 21st New Zealand Conference on Microscopy. Wellington, New Zealand edn, vol. Not available, Not Available, Not available, pp. L14-L15, Charge Contrast imaging and X-Ray Microanalysis in Variable Pressure SEM- Benefits and Limitations, 1/01/03.

TY - GEN

T1 - Charge Contrast imaging and X-Ray Microanalysis in Variable Pressure SEM- Benefits and Limitations

AU - Griffin, Brendan

PY - 2003

Y1 - 2003

M3 - Conference paper

VL - Not available

SP - L14-L15

BT - 21st New Zealand Conference on Microscopy

A2 - Available, Not

PB - Not Available

CY - Not available

T2 - Charge Contrast imaging and X-Ray Microanalysis in Variable Pressure SEM- Benefits and Limitations

Y2 - 1 January 2003

ER -