Characterization of mechanical, optical and structural properties of bismuth oxide thin films as a write-once medium for blue laser recording

Mariusz Martyniuk, D.A. Baldwin, R.D. Jeffery, K.K.M.B.D. Silva, Rob Woodward, John Cliff, R.N. Krishnan, John Dell, Lorenzo Faraone

Research output: Chapter in Book/Conference paperConference paperpeer-review

Abstract

We report on the preparation and characterization of crystalline bismuth oxide thin films via Biased Target Ion Beam Deposition method. A focused blue laser (405nm) is used to write an array of dots in the bismuth oxide thin film and demonstrate clear and circular recording marks in form of bubbles or little volcanos (FWHM ∼500nm). Results indicate excellent static recording characteristics, writing sensitivity and contrast. The recording mechanism is investigated and is believed to be related to laser-induced morphology change. Copyright © Materials Research Society 2014.
Original languageEnglish
Title of host publicationCharacterization of mechanical, optical and structural properties of bismuth oxide thin films as a write-once medium for blue laser recording
Place of PublicationUnited States
PublisherMaterials Research Society
Pages145
Volume1633
ISBN (Print)02729172
Publication statusPublished - 2014
Event2013 MRS Fall Meeting - Boston, United States
Duration: 1 Dec 20136 Dec 2013

Conference

Conference2013 MRS Fall Meeting
Country/TerritoryUnited States
CityBoston
Period1/12/136/12/13

Fingerprint

Dive into the research topics of 'Characterization of mechanical, optical and structural properties of bismuth oxide thin films as a write-once medium for blue laser recording'. Together they form a unique fingerprint.

Cite this