Characterization of exchange-biased CoFe/(Co,Fe)O thin films by magnetometry and ferromagnetic resonance techniques

Rhet Magaraggia, Mikhail Kostylev, Robert Stamps, K.-W. Lin, J.-Y. Guo, K.-J. Yang, R.D. Desautels, J. Van Lierop

Research output: Contribution to journal › Article

6 Citations (Scopus)

Original language	English
Pages (from-to)	5pp
Journal	IEEE Transactions on Magnetics
Volume	47
DOIs	https://doi.org/10.1109/TMAG.2011.2105466
Publication status	Published - 2011

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title = "Characterization of exchange-biased CoFe/(Co,Fe)O thin films by magnetometry and ferromagnetic resonance techniques",

author = "Rhet Magaraggia and Mikhail Kostylev and Robert Stamps and K.-W. Lin and J.-Y. Guo and K.-J. Yang and R.D. Desautels and {Van Lierop}, J.",

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doi = "10.1109/TMAG.2011.2105466",

language = "English",

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T1 - Characterization of exchange-biased CoFe/(Co,Fe)O thin films by magnetometry and ferromagnetic resonance techniques

AU - Magaraggia, Rhet

AU - Kostylev, Mikhail

AU - Stamps, Robert

AU - Lin, K.-W.

AU - Guo, J.-Y.

AU - Yang, K.-J.

AU - Desautels, R.D.

AU - Van Lierop, J.

PY - 2011

Y1 - 2011

U2 - 10.1109/TMAG.2011.2105466

DO - 10.1109/TMAG.2011.2105466

M3 - Article

VL - 47

SP - 5pp

JO - Institute of Electrical and Electronics Engineers Transactions on Magnetics

JF - Institute of Electrical and Electronics Engineers Transactions on Magnetics

SN - 0018-9464

ER -