Original language | English |
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Pages (from-to) | 5pp |
Journal | IEEE Transactions on Magnetics |
Volume | 47 |
DOIs | |
Publication status | Published - 2011 |
Characterization of exchange-biased CoFe/(Co,Fe)O thin films by magnetometry and ferromagnetic resonance techniques
Rhet Magaraggia, Mikhail Kostylev, Robert Stamps, K.-W. Lin, J.-Y. Guo, K.-J. Yang, R.D. Desautels, J. Van Lierop
Research output: Contribution to journal › Article › peer-review
6
Citations
(Scopus)