Characterization of exchange-biased CoFe/(Co,Fe)O thin films by magnetometry and ferromagnetic resonance techniques

Rhet Magaraggia, Mikhail Kostylev, Robert Stamps, K.-W. Lin, J.-Y. Guo, K.-J. Yang, R.D. Desautels, J. Van Lierop

    Research output: Contribution to journalArticle

    6 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)5pp
    JournalIEEE Transactions on Magnetics
    Volume47
    DOIs
    Publication statusPublished - 2011

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