Abstract
Transport properties of two distinct electron species in indium nitride grown by molecular beam epitaxy (MBE) have been measured. Variable field Hall and resisitivity voltages were used in a quantitative mobility spectrum analysis (QMSA) to extract the concentrations and mobilities of the two electron species; attributed to the bulk electrons and a surface accumulation layer. Single magnetic field data corresponds to neither electron species. The bulk electron distribution has an extracted average mobility of 3570cm(2)/(Vs) at 300 K, which rises to over 5100cm(2)/(Vs) at 150 K. Bulk electron concentration in the sample is 1.5 x 10(17) cm(-3). The surface electrons have a higher sheet charge density and an order of magnitude lower average mobility than those in the bulk.
Original language | English |
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Pages (from-to) | L1090-L1092 |
Journal | Japanese Journal of Applied Physics |
Volume | 45 |
Issue number | 41 |
DOIs | |
Publication status | Published - 2006 |