Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy

Charles Musca, V. Chan, Richard Sewell, John Dell, Lorenzo Faraone

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publication2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings
EditorsAleksandar D. Raki&#263, Yew Tong Yeow
Place of PublicationUnited States
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages89-92
VolumeNot applicable
EditionBrisbane, Australia
ISBN (Print)0780388208
Publication statusPublished - 2005
EventCharacterisation of MBE grown HgCdTe Using Scanning Laser Microscopy - Brisbane, Australia
Duration: 1 Jan 2005 → …

Conference

ConferenceCharacterisation of MBE grown HgCdTe Using Scanning Laser Microscopy
Period1/01/05 → …

Cite this

Musca, C., Chan, V., Sewell, R., Dell, J., & Faraone, L. (2005). Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy. In A. D. Raki&#263, & Y. T. Yeow (Eds.), 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings (Brisbane, Australia ed., Vol. Not applicable, pp. 89-92). United States: IEEE, Institute of Electrical and Electronics Engineers.