Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy

Charles Musca; V. Chan; Richard Sewell; John Dell; Lorenzo Faraone

Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy

Charles Musca, V. Chan, Richard Sewell, John Dell, Lorenzo Faraone

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings
Editors	Aleksandar D. Raki&#263, Yew Tong Yeow
Place of Publication	United States
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	89-92
Volume	Not applicable
Edition	Brisbane, Australia
ISBN (Print)	0780388208
Publication status	Published - 2005
Event	Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy - Brisbane, Australia Duration: 1 Jan 2005 → …

Conference

Conference	Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy
Period	1/01/05 → …

Cite this

Musca, C., Chan, V., Sewell, R., Dell, J., & Faraone, L. (2005). Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy. In A. D. Raki&#263, & Y. T. Yeow (Eds.), 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings (Brisbane, Australia ed., Vol. Not applicable, pp. 89-92). IEEE, Institute of Electrical and Electronics Engineers.

Musca, Charles ; Chan, V. ; Sewell, Richard et al. / Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy. 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings. editor / Aleksandar D. Raki&#263 ; Yew Tong Yeow. Vol. Not applicable Brisbane, Australia. ed. United States : IEEE, Institute of Electrical and Electronics Engineers, 2005. pp. 89-92

@inproceedings{31a4d9a326a74cc3ae27603e1cb76d4b,

title = "Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy",

author = "Charles Musca and V. Chan and Richard Sewell and John Dell and Lorenzo Faraone",

year = "2005",

language = "English",

isbn = "0780388208",

volume = "Not applicable",

pages = "89--92",

editor = "Raki&#263, {Aleksandar D.} and Yeow, {Yew Tong}",

booktitle = "2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "Brisbane, Australia",

note = "Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy ; Conference date: 01-01-2005",

}

Musca, C, Chan, V, Sewell, R, Dell, J & Faraone, L 2005, Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy. in AD Raki&#263 & YT Yeow (eds), 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings. Brisbane, Australia edn, vol. Not applicable, IEEE, Institute of Electrical and Electronics Engineers, United States, pp. 89-92, Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy, 1/01/05.

Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy. / Musca, Charles; Chan, V.; Sewell, Richard et al.
2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings. ed. / Aleksandar D. Rakić Yew Tong Yeow. Vol. Not applicable Brisbane, Australia. ed. United States: IEEE, Institute of Electrical and Electronics Engineers, 2005. p. 89-92.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy

AU - Musca, Charles

AU - Chan, V.

AU - Sewell, Richard

AU - Dell, John

AU - Faraone, Lorenzo

PY - 2005

Y1 - 2005

M3 - Conference paper

SN - 0780388208

VL - Not applicable

SP - 89

EP - 92

BT - 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings

A2 - Raki&#263, Aleksandar D.

A2 - Yeow, Yew Tong

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - United States

T2 - Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy

Y2 - 1 January 2005

ER -

Musca C, Chan V, Sewell R, Dell J , Faraone L. Characterisation of MBE grown HgCdTe Using Scanning Laser Microscopy. In Raki&#263 AD, Yeow YT, editors, 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings. Brisbane, Australia ed. Vol. Not applicable. United States: IEEE, Institute of Electrical and Electronics Engineers. 2005. p. 89-92