Capillarity at the nanoscale: an AFM view

F. Mugele, Thomas Becker, R. Nikopoulos, M. Kohonen, S. Herminghaus

Research output: Contribution to journalArticle

51 Citations (Scopus)
Original languageEnglish
Pages (from-to)951-964
JournalJournal of Adhesion Science and Technology
Volume16
Issue number7
Publication statusPublished - 2002

Cite this

Mugele, F., Becker, T., Nikopoulos, R., Kohonen, M., & Herminghaus, S. (2002). Capillarity at the nanoscale: an AFM view. Journal of Adhesion Science and Technology, 16(7), 951-964.
Mugele, F. ; Becker, Thomas ; Nikopoulos, R. ; Kohonen, M. ; Herminghaus, S. / Capillarity at the nanoscale: an AFM view. In: Journal of Adhesion Science and Technology. 2002 ; Vol. 16, No. 7. pp. 951-964.
@article{af40fdf7d96a48c895ad4909e604448c,
title = "Capillarity at the nanoscale: an AFM view",
author = "F. Mugele and Thomas Becker and R. Nikopoulos and M. Kohonen and S. Herminghaus",
year = "2002",
language = "English",
volume = "16",
pages = "951--964",
journal = "Journal of Adhesion Science and Technology",
issn = "0169-4243",
publisher = "Taylor & Francis",
number = "7",

}

Mugele, F, Becker, T, Nikopoulos, R, Kohonen, M & Herminghaus, S 2002, 'Capillarity at the nanoscale: an AFM view' Journal of Adhesion Science and Technology, vol. 16, no. 7, pp. 951-964.

Capillarity at the nanoscale: an AFM view. / Mugele, F.; Becker, Thomas; Nikopoulos, R.; Kohonen, M.; Herminghaus, S.

In: Journal of Adhesion Science and Technology, Vol. 16, No. 7, 2002, p. 951-964.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Capillarity at the nanoscale: an AFM view

AU - Mugele, F.

AU - Becker, Thomas

AU - Nikopoulos, R.

AU - Kohonen, M.

AU - Herminghaus, S.

PY - 2002

Y1 - 2002

M3 - Article

VL - 16

SP - 951

EP - 964

JO - Journal of Adhesion Science and Technology

JF - Journal of Adhesion Science and Technology

SN - 0169-4243

IS - 7

ER -

Mugele F, Becker T, Nikopoulos R, Kohonen M, Herminghaus S. Capillarity at the nanoscale: an AFM view. Journal of Adhesion Science and Technology. 2002;16(7):951-964.