Background variability modeling for statistical layout analysis

Faisal Shafait, J. Van Beusekom, D. Keysers, T.M. Breuel

    Research output: Chapter in Book/Conference paperConference paperpeer-review

    7 Citations (Scopus)
    Original languageEnglish
    Title of host publication19th International Conference on Pattern Recognition, 2008. ICPR 2008
    Place of PublicationUSA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages4pp
    Volume1
    ISBN (Print)9781424421756
    DOIs
    Publication statusPublished - 2008
    Event19th International Conference on Pattern Recognition - Tampa, United States
    Duration: 8 Dec 200811 Dec 2008

    Conference

    Conference19th International Conference on Pattern Recognition
    Abbreviated titleICPR 2008
    Country/TerritoryUnited States
    CityTampa
    Period8/12/0811/12/08

    Cite this