Background variability modeling for statistical layout analysis

Faisal Shafait, J. Van Beusekom, D. Keysers, T.M. Breuel

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	19th International Conference on Pattern Recognition, 2008. ICPR 2008
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	4pp
Volume	1
ISBN (Print)	9781424421756
DOIs	https://doi.org/10.1109/ICPR.2008.4760964
Publication status	Published - 2008
Event	19th International Conference on Pattern Recognition - Tampa, United States Duration: 8 Dec 2008 → 11 Dec 2008

Conference	19th International Conference on Pattern Recognition
Abbreviated title	ICPR 2008
Country/Territory	United States
City	Tampa
Period	8/12/08 → 11/12/08

Access to Document

@inproceedings{8aea91e68eed4ee9884dd3a9aa86ecff,

title = "Background variability modeling for statistical layout analysis",

author = "Faisal Shafait and {Van Beusekom}, J. and D. Keysers and T.M. Breuel",

year = "2008",

doi = "10.1109/ICPR.2008.4760964",

language = "English",

isbn = "9781424421756",

volume = "1",

pages = "4pp",

booktitle = "19th International Conference on Pattern Recognition, 2008. ICPR 2008",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

note = "19th International Conference on Pattern Recognition, ICPR 2008 ; Conference date: 08-12-2008 Through 11-12-2008",

}

Shafait, F, Van Beusekom, J, Keysers, D & Breuel, TM 2008, Background variability modeling for statistical layout analysis. in 19th International Conference on Pattern Recognition, 2008. ICPR 2008. vol. 1, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 4pp, 19th International Conference on Pattern Recognition, Tampa, United States, 8/12/08. https://doi.org/10.1109/ICPR.2008.4760964

TY - GEN

T1 - Background variability modeling for statistical layout analysis

AU - Shafait, Faisal

AU - Van Beusekom, J.

AU - Keysers, D.

AU - Breuel, T.M.

PY - 2008

Y1 - 2008

U2 - 10.1109/ICPR.2008.4760964

DO - 10.1109/ICPR.2008.4760964

M3 - Conference paper

SN - 9781424421756

VL - 1

SP - 4pp

BT - 19th International Conference on Pattern Recognition, 2008. ICPR 2008

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - 19th International Conference on Pattern Recognition

Y2 - 8 December 2008 through 11 December 2008

ER -