Automatic Feature Learning for Robust Shadow Detection

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	IEEE Conference on Computer Vision and Pattern Recognition
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	1939-1946
Volume	1
ISBN (Print)	9781479951178
DOIs	https://doi.org/10.1109/CVPR.2014.249
Publication status	Published - 2014
Event	2014 IEEE Conference on Computer Vision and Pattern Recognition - USA, Columbus, United States Duration: 23 Jun 2014 → 28 Jun 2014 Conference number: 114804

Conference	2014 IEEE Conference on Computer Vision and Pattern Recognition
Abbreviated title	CVPR
Country	United States
City	Columbus
Period	23/06/14 → 28/06/14

Access to Document

@inproceedings{6b7fb0cb20184c9990eba55d3a3338c9,

title = "Automatic Feature Learning for Robust Shadow Detection",

author = "S.H. Khan and Mohammed Bennamoun and Ferdous Sohel and Roberto Togneri",

year = "2014",

doi = "10.1109/CVPR.2014.249",

language = "English",

isbn = "9781479951178",

volume = "1",

pages = "1939--1946",

booktitle = "IEEE Conference on Computer Vision and Pattern Recognition",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2014 IEEE Conference on Computer Vision and Pattern Recognition, CVPR ; Conference date: 23-06-2014 Through 28-06-2014",

}

Khan, SH, Bennamoun, M , Sohel, F & Togneri, R 2014, Automatic Feature Learning for Robust Shadow Detection. in IEEE Conference on Computer Vision and Pattern Recognition. vol. 1, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 1939-1946, 2014 IEEE Conference on Computer Vision and Pattern Recognition, Columbus, United States, 23/06/14. https://doi.org/10.1109/CVPR.2014.249

TY - GEN

T1 - Automatic Feature Learning for Robust Shadow Detection

AU - Khan, S.H.

AU - Bennamoun, Mohammed

AU - Sohel, Ferdous

AU - Togneri, Roberto

N1 - Conference code: 114804

PY - 2014

Y1 - 2014

U2 - 10.1109/CVPR.2014.249

DO - 10.1109/CVPR.2014.249

M3 - Conference paper

SN - 9781479951178

VL - 1

SP - 1939

EP - 1946

BT - IEEE Conference on Computer Vision and Pattern Recognition

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - 2014 IEEE Conference on Computer Vision and Pattern Recognition

Y2 - 23 June 2014 through 28 June 2014

ER -