Automatic Feature Learning for Robust Shadow Detection

    Research output: Chapter in Book/Conference paperConference paper

    68 Citations (Scopus)
    Original languageEnglish
    Title of host publicationIEEE Conference on Computer Vision and Pattern Recognition
    Place of PublicationUSA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages1939-1946
    Volume1
    ISBN (Print)9781479951178
    DOIs
    Publication statusPublished - 2014
    Event2014 IEEE Conference on Computer Vision and Pattern Recognition - USA, Columbus, United States
    Duration: 23 Jun 201428 Jun 2014
    Conference number: 114804

    Conference

    Conference2014 IEEE Conference on Computer Vision and Pattern Recognition
    Abbreviated titleCVPR
    CountryUnited States
    CityColumbus
    Period23/06/1428/06/14

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