Automatic Feature Learning for Robust Shadow Detection

    Research output: Chapter in Book/Conference paperConference paper

    52 Citations (Scopus)
    Original languageEnglish
    Title of host publicationIEEE Conference on Computer Vision and Pattern Recognition
    Place of PublicationUSA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages1939-1946
    Volume1
    ISBN (Print)9781479951178
    DOIs
    Publication statusPublished - 2014
    Event2014 IEEE Conference on Computer Vision and Pattern Recognition - USA, Columbus, United States
    Duration: 23 Jun 201428 Jun 2014
    Conference number: 114804

    Conference

    Conference2014 IEEE Conference on Computer Vision and Pattern Recognition
    Abbreviated titleCVPR
    CountryUnited States
    CityColumbus
    Period23/06/1428/06/14

    Cite this

    Khan, S. H., Bennamoun, M., Sohel, F., & Togneri, R. (2014). Automatic Feature Learning for Robust Shadow Detection. In IEEE Conference on Computer Vision and Pattern Recognition (Vol. 1, pp. 1939-1946). USA: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CVPR.2014.249
    Khan, S.H. ; Bennamoun, Mohammed ; Sohel, Ferdous ; Togneri, Roberto. / Automatic Feature Learning for Robust Shadow Detection. IEEE Conference on Computer Vision and Pattern Recognition. Vol. 1 USA : IEEE, Institute of Electrical and Electronics Engineers, 2014. pp. 1939-1946
    @inproceedings{6b7fb0cb20184c9990eba55d3a3338c9,
    title = "Automatic Feature Learning for Robust Shadow Detection",
    author = "S.H. Khan and Mohammed Bennamoun and Ferdous Sohel and Roberto Togneri",
    year = "2014",
    doi = "10.1109/CVPR.2014.249",
    language = "English",
    isbn = "9781479951178",
    volume = "1",
    pages = "1939--1946",
    booktitle = "IEEE Conference on Computer Vision and Pattern Recognition",
    publisher = "IEEE, Institute of Electrical and Electronics Engineers",
    address = "United States",

    }

    Khan, SH, Bennamoun, M, Sohel, F & Togneri, R 2014, Automatic Feature Learning for Robust Shadow Detection. in IEEE Conference on Computer Vision and Pattern Recognition. vol. 1, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 1939-1946, 2014 IEEE Conference on Computer Vision and Pattern Recognition, Columbus, United States, 23/06/14. https://doi.org/10.1109/CVPR.2014.249

    Automatic Feature Learning for Robust Shadow Detection. / Khan, S.H.; Bennamoun, Mohammed; Sohel, Ferdous; Togneri, Roberto.

    IEEE Conference on Computer Vision and Pattern Recognition. Vol. 1 USA : IEEE, Institute of Electrical and Electronics Engineers, 2014. p. 1939-1946.

    Research output: Chapter in Book/Conference paperConference paper

    TY - GEN

    T1 - Automatic Feature Learning for Robust Shadow Detection

    AU - Khan, S.H.

    AU - Bennamoun, Mohammed

    AU - Sohel, Ferdous

    AU - Togneri, Roberto

    PY - 2014

    Y1 - 2014

    U2 - 10.1109/CVPR.2014.249

    DO - 10.1109/CVPR.2014.249

    M3 - Conference paper

    SN - 9781479951178

    VL - 1

    SP - 1939

    EP - 1946

    BT - IEEE Conference on Computer Vision and Pattern Recognition

    PB - IEEE, Institute of Electrical and Electronics Engineers

    CY - USA

    ER -

    Khan SH, Bennamoun M, Sohel F, Togneri R. Automatic Feature Learning for Robust Shadow Detection. In IEEE Conference on Computer Vision and Pattern Recognition. Vol. 1. USA: IEEE, Institute of Electrical and Electronics Engineers. 2014. p. 1939-1946 https://doi.org/10.1109/CVPR.2014.249