| Original language | English |
|---|---|
| Title of host publication | IEEE Conference on Computer Vision and Pattern Recognition |
| Place of Publication | USA |
| Publisher | IEEE, Institute of Electrical and Electronics Engineers |
| Pages | 1939-1946 |
| Volume | 1 |
| ISBN (Print) | 9781479951178 |
| DOIs | |
| Publication status | Published - 2014 |
| Event | 2014 IEEE Conference on Computer Vision and Pattern Recognition - USA, Columbus, United States Duration: 23 Jun 2014 → 28 Jun 2014 Conference number: 114804 |
Conference
| Conference | 2014 IEEE Conference on Computer Vision and Pattern Recognition |
|---|---|
| Abbreviated title | CVPR |
| Country | United States |
| City | Columbus |
| Period | 23/06/14 → 28/06/14 |
Cite this
Khan, S. H., Bennamoun, M., Sohel, F., & Togneri, R. (2014). Automatic Feature Learning for Robust Shadow Detection. In IEEE Conference on Computer Vision and Pattern Recognition (Vol. 1, pp. 1939-1946). USA: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CVPR.2014.249
@inproceedings{6b7fb0cb20184c9990eba55d3a3338c9,
title = "Automatic Feature Learning for Robust Shadow Detection",
author = "S.H. Khan and Mohammed Bennamoun and Ferdous Sohel and Roberto Togneri",
year = "2014",
doi = "10.1109/CVPR.2014.249",
language = "English",
isbn = "9781479951178",
volume = "1",
pages = "1939--1946",
booktitle = "IEEE Conference on Computer Vision and Pattern Recognition",
publisher = "IEEE, Institute of Electrical and Electronics Engineers",
address = "United States",
}
Khan, SH, Bennamoun, M, Sohel, F & Togneri, R 2014, Automatic Feature Learning for Robust Shadow Detection. in IEEE Conference on Computer Vision and Pattern Recognition. vol. 1, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 1939-1946, 2014 IEEE Conference on Computer Vision and Pattern Recognition, Columbus, United States, 23/06/14. https://doi.org/10.1109/CVPR.2014.249
Automatic Feature Learning for Robust Shadow Detection. / Khan, S.H.; Bennamoun, Mohammed; Sohel, Ferdous; Togneri, Roberto.
IEEE Conference on Computer Vision and Pattern Recognition. Vol. 1 USA : IEEE, Institute of Electrical and Electronics Engineers, 2014. p. 1939-1946.Research output: Chapter in Book/Conference paper › Conference paper
TY - GEN
T1 - Automatic Feature Learning for Robust Shadow Detection
AU - Khan, S.H.
AU - Bennamoun, Mohammed
AU - Sohel, Ferdous
AU - Togneri, Roberto
PY - 2014
Y1 - 2014
U2 - 10.1109/CVPR.2014.249
DO - 10.1109/CVPR.2014.249
M3 - Conference paper
SN - 9781479951178
VL - 1
SP - 1939
EP - 1946
BT - IEEE Conference on Computer Vision and Pattern Recognition
PB - IEEE, Institute of Electrical and Electronics Engineers
CY - USA
ER -
Khan SH, Bennamoun M, Sohel F, Togneri R. Automatic Feature Learning for Robust Shadow Detection. In IEEE Conference on Computer Vision and Pattern Recognition. Vol. 1. USA: IEEE, Institute of Electrical and Electronics Engineers. 2014. p. 1939-1946 https://doi.org/10.1109/CVPR.2014.249