Auto-calibration via the Absolute Quadric and Scene Constraints

A. Heyden, Du Huynh

Research output: Chapter in Book/Conference paperConference paper

8 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings 16th International Conference on Pattern Recognition
Place of PublicationLos Alamitos, California, USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages631-634
Volume2
EditionQuebec, Canada
ISBN (Print)10514651
Publication statusPublished - 2002
EventAuto-calibration via the Absolute Quadric and Scene Constraints - Quebec, Canada
Duration: 1 Jan 2002 → …

Conference

ConferenceAuto-calibration via the Absolute Quadric and Scene Constraints
Period1/01/02 → …

Cite this

Heyden, A., & Huynh, D. (2002). Auto-calibration via the Absolute Quadric and Scene Constraints. In Proceedings 16th International Conference on Pattern Recognition (Quebec, Canada ed., Vol. 2, pp. 631-634). Los Alamitos, California, USA: IEEE, Institute of Electrical and Electronics Engineers.