Atomic scale properties of interfaces in high-k gate oxide materials

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publication8th Asia-Pacific Conference on Electron Microscopy
EditorsThe Japanese Society Of Microscopy
Place of PublicationJapan
PublisherKanazawa Medical Univeristy
Pages60
Volume0
EditionKanazawa, Japan
Publication statusPublished - 2004
EventAtomic scale properties of interfaces in high-k gate oxide materials - Kanazawa, Japan
Duration: 1 Jan 2004 → …

Conference

ConferenceAtomic scale properties of interfaces in high-k gate oxide materials
Period1/01/04 → …

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