@inproceedings{cb45d82b7acb4ab68614653cf75d7c2a,
title = "Atom Probe Tomography Studies of GaN-Based Semiconductor Materials",
author = "S. Bennett and R.A. Oliver and David Saxey and A. Cerezo and P.H. Clifton and R.M. Ulfig and M.J. Kappers and C.J. Humphreys",
year = "2009",
doi = "10.1017/S1431927609097979",
language = "English",
isbn = "14319276",
volume = "15 S02",
pages = "280--281",
booktitle = "Microscopy and Microanalysis 2009",
publisher = "Cambridge University Press",
address = "United Kingdom",
note = "Microscopy and Microanalysis 2009 ; Conference date: 26-07-2009 Through 30-07-2009",
}