Atom Probe Tomography Studies of GaN-Based Semiconductor Materials

S. Bennett, R.A. Oliver, David Saxey, A. Cerezo, P.H. Clifton, R.M. Ulfig, M.J. Kappers, C.J. Humphreys

Research output: Chapter in Book/Conference paperConference paper

1 Citation (Scopus)
Original languageEnglish
Title of host publicationMicroscopy and Microanalysis 2009
Place of PublicationCambridge, UK
PublisherCambridge University Press
Pages280-281
Volume15 S02
ISBN (Print)14319276
DOIs
Publication statusPublished - 2009
EventAtom Probe Tomography Studies of GaN-Based Semiconductor Materials - Richmond Virginia, USA
Duration: 1 Jan 2009 → …

Conference

ConferenceAtom Probe Tomography Studies of GaN-Based Semiconductor Materials
Period1/01/09 → …

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