Atom probe tomography assessment of the impact of electron beam exposure on InxGa1-xN/GaN quantum wells

S.E. Bennett, David Saxey, M.J. Kappers, J.S. Barnard, C.J. Humphreys, G.D.W. Smith, R.A. Oliver

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@article{d94933ba488f4e1c8b28b3fae74fae1d,

title = "Atom probe tomography assessment of the impact of electron beam exposure on InxGa1-xN/GaN quantum wells",

author = "S.E. Bennett and David Saxey and M.J. Kappers and J.S. Barnard and C.J. Humphreys and G.D.W. Smith and R.A. Oliver",

year = "2011",

doi = "10.1063/1.3610468",

language = "English",

volume = "99",

pages = "N/A",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Atom probe tomography assessment of the impact of electron beam exposure on InxGa1-xN/GaN quantum wells

AU - Bennett, S.E.

AU - Saxey, David

AU - Kappers, M.J.

AU - Barnard, J.S.

AU - Humphreys, C.J.

AU - Smith, G.D.W.

AU - Oliver, R.A.

PY - 2011

Y1 - 2011

U2 - 10.1063/1.3610468

DO - 10.1063/1.3610468

M3 - Article

SN - 0003-6951

VL - 99

SP - N/A

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -