Atom probe specimen fabrication methods using a dual FIB/SEM

David Saxey, J.M. Cairney, D. Mcgrouther, T. Honma, S.P. Ringer

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@article{7018677049504c15bdf501e50fa57256,

title = "Atom probe specimen fabrication methods using a dual FIB/SEM",

author = "David Saxey and J.M. Cairney and D. Mcgrouther and T. Honma and S.P. Ringer",

year = "2007",

doi = "10.1016/j.ultramic.2007.02.024",

language = "English",

volume = "107",

pages = "756--760",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Pergamon",

}

TY - JOUR

T1 - Atom probe specimen fabrication methods using a dual FIB/SEM

AU - Saxey, David

AU - Cairney, J.M.

AU - Mcgrouther, D.

AU - Honma, T.

AU - Ringer, S.P.

PY - 2007

Y1 - 2007

U2 - 10.1016/j.ultramic.2007.02.024

DO - 10.1016/j.ultramic.2007.02.024

M3 - Article

C2 - 17482366

SN - 0304-3991

VL - 107

SP - 756

EP - 760

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -