Application of FIB-ToF-SIMS to the Search for and Characterisation of Enriched Uranium Particles

William D.A. Rickard; Xiao Sun; M. Aleshin; L. Martin; Masturina Kracica; Daniel Oldfield; Denis Fougerouse; Steven Reddy; David W. Saxey

doi:10.1093/micmic/ozad067.248

Application of FIB-ToF-SIMS to the Search for and Characterisation of Enriched Uranium Particles

William D.A. Rickard, Xiao Sun, M. Aleshin, L. Martin, Masturina Kracica, Daniel Oldfield, Denis Fougerouse, Steven Reddy, David W. Saxey

Centre for Microscopy, Characterisation & Analysis

Research output: Contribution to journal › Abstract/Meeting Abstract › peer-review

Original language	English
Pages (from-to)	528-529
Number of pages	2
Journal	Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume	29
Issue number	1
Early online date	22 Jul 2023
DOIs	https://doi.org/10.1093/micmic/ozad067.248
Publication status	Published - 1 Aug 2023

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10.1093/micmic/ozad067.248

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Rickard, W. D. A., Sun, X., Aleshin, M., Martin, L., Kracica, M., Oldfield, D., Fougerouse, D., Reddy, S., & Saxey, D. W. (2023). Application of FIB-ToF-SIMS to the Search for and Characterisation of Enriched Uranium Particles. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29(1), 528-529. https://doi.org/10.1093/micmic/ozad067.248

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title = "Application of FIB-ToF-SIMS to the Search for and Characterisation of Enriched Uranium Particles",

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Rickard, WDA, Sun, X , Aleshin, M , Martin, L, Kracica, M, Oldfield, D, Fougerouse, D, Reddy, S & Saxey, DW 2023, 'Application of FIB-ToF-SIMS to the Search for and Characterisation of Enriched Uranium Particles', Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 29, no. 1, pp. 528-529. https://doi.org/10.1093/micmic/ozad067.248

Application of FIB-ToF-SIMS to the Search for and Characterisation of Enriched Uranium Particles. / Rickard, William D.A.; Sun, Xiao ; Aleshin, M. et al.
In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, Vol. 29, No. 1, 01.08.2023, p. 528-529.

Research output: Contribution to journal › Abstract/Meeting Abstract › peer-review

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T1 - Application of FIB-ToF-SIMS to the Search for and Characterisation of Enriched Uranium Particles

AU - Rickard, William D.A.

AU - Sun, Xiao

AU - Aleshin, M.

AU - Martin, L.

AU - Kracica, Masturina

AU - Oldfield, Daniel

AU - Fougerouse, Denis

AU - Reddy, Steven

AU - Saxey, David W.

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DO - 10.1093/micmic/ozad067.248

M3 - Abstract/Meeting Abstract

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AN - SCOPUS:85168601752

SN - 1083-0375

VL - 29

SP - 528

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JO - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

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Rickard WDA, Sun X , Aleshin M , Martin L, Kracica M, Oldfield D et al. Application of FIB-ToF-SIMS to the Search for and Characterisation of Enriched Uranium Particles. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 2023 Aug 1;29(1):528-529. Epub 2023 Jul 22. doi: 10.1093/micmic/ozad067.248

Application of FIB-ToF-SIMS to the Search for and Characterisation of Enriched Uranium Particles

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