Original language | English |
---|---|
Pages (from-to) | 2354-2357 |
Journal | Journal of Applied Physics |
Volume | 74 |
Issue number | 3 |
Publication status | Published - 1994 |
Annealing Behaviour of Deep-Level Defects in 1MeV Electron Irradiated GaAs
S.T. Lai, Brett Nener
Research output: Contribution to journal › Article › peer-review