Annealing Behaviour of Deep-Level Defects in 1MeV Electron Irradiated GaAs

S.T. Lai, Brett Nener

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)2354-2357
JournalJournal of Applied Physics
Volume74
Issue number3
Publication statusPublished - 1994

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