Analytical Electron Micrsocopy of High Temperature Implanted SiC

Alexandra Suvorova; Martin Saunders; I. Usov; A. Suvorov

Analytical Electron Micrsocopy of High Temperature Implanted SiC

Alexandra Suvorova, Martin Saunders, I. Usov, A. Suvorov

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings 1. Physics, Materials and Earth Sciences
Editors	Cross, R., Engelbrecht, J. Witcomb, M., Sewell, T., P. Richards
Place of Publication	South Africa
Publisher	Microscopy Society of Southern Africa
Pages	67-68
Volume	1
Edition	South Africa
ISBN (Print)	0620292946
Publication status	Published - 2002
Event	Analytical Electron Micrsocopy of High Temperature Implanted SiC - South Africa Duration: 1 Jan 2002 → …

Conference

Conference	Analytical Electron Micrsocopy of High Temperature Implanted SiC
Period	1/01/02 → …

Cite this

@inproceedings{d644f9054eb549f8a608f4378f4d56dc,

title = "Analytical Electron Micrsocopy of High Temperature Implanted SiC",

author = "Alexandra Suvorova and Martin Saunders and I. Usov and A. Suvorov",

year = "2002",

language = "English",

isbn = "0620292946",

volume = "1",

pages = "67--68",

editor = "Cross and R. and Engelbrecht and J. Witcomb and M. and Sewell and T. and P. Richards",

booktitle = "Proceedings 1. Physics, Materials and Earth Sciences",

publisher = "Microscopy Society of Southern Africa",

edition = "South Africa",

note = "Analytical Electron Micrsocopy of High Temperature Implanted SiC ; Conference date: 01-01-2002",

}

Suvorova, A , Saunders, M, Usov, I & Suvorov, A 2002, Analytical Electron Micrsocopy of High Temperature Implanted SiC. in Cross, R., Engelbrecht, J Witcomb, M., Sewell, T. & P Richards (eds), Proceedings 1. Physics, Materials and Earth Sciences. South Africa edn, vol. 1, Microscopy Society of Southern Africa, South Africa, pp. 67-68, Analytical Electron Micrsocopy of High Temperature Implanted SiC, 1/01/02.

Analytical Electron Micrsocopy of High Temperature Implanted SiC. / Suvorova, Alexandra ; Saunders, Martin; Usov, I. et al.

Proceedings 1. Physics, Materials and Earth Sciences. ed. / Cross; R.; Engelbrecht; J. Witcomb; M.; Sewell; T.; P. Richards. Vol. 1 South Africa. ed. South Africa : Microscopy Society of Southern Africa, 2002. p. 67-68.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Analytical Electron Micrsocopy of High Temperature Implanted SiC

AU - Suvorova, Alexandra

AU - Saunders, Martin

AU - Usov, I.

AU - Suvorov, A.

PY - 2002

Y1 - 2002

M3 - Conference paper

SN - 0620292946

VL - 1

SP - 67

EP - 68

BT - Proceedings 1. Physics, Materials and Earth Sciences

A2 - Cross, null

A2 - R., null

A2 - Engelbrecht, null

A2 - Witcomb, J.

A2 - M., null

A2 - Sewell, null

A2 - T., null

A2 - Richards, P.

PB - Microscopy Society of Southern Africa

CY - South Africa

T2 - Analytical Electron Micrsocopy of High Temperature Implanted SiC

Y2 - 1 January 2002

ER -