Analytical Electron Microscopy of Nanostructured SemiConductor Materials

Alexandra Suvorova; Martin Saunders

Analytical Electron Microscopy of Nanostructured SemiConductor Materials

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	17th Australian Conference on Electron Microscopy
Editors	Terlet, J. Self, P., Henderson, M., M. Dayman
Place of Publication	Adelaide, South Australia
Publisher	Australian Society for Electron Microscopy Inc.
Pages	86
Volume	One
Edition	Adelaide, South Australia
ISBN (Print)	095804080X
Publication status	Published - 2002
Event	Analytical Electron Microscopy of Nanostructured SemiConductor Materials - Adelaide, South Australia Duration: 1 Jan 2002 → …

Conference

Conference	Analytical Electron Microscopy of Nanostructured SemiConductor Materials
Period	1/01/02 → …

Cite this

@inproceedings{a47fece0f2c644c9abeba7ca1ad86098,

title = "Analytical Electron Microscopy of Nanostructured SemiConductor Materials",

author = "Alexandra Suvorova and Martin Saunders",

year = "2002",

language = "English",

isbn = "095804080X",

volume = "One",

pages = "86",

editor = "Terlet and J. Self and P. and Henderson and M. and M. Dayman",

booktitle = "17th Australian Conference on Electron Microscopy",

publisher = "Australian Society for Electron Microscopy Inc.",

edition = "Adelaide, South Australia",

note = "Analytical Electron Microscopy of Nanostructured SemiConductor Materials ; Conference date: 01-01-2002",

}

Suvorova, A & Saunders, M 2002, Analytical Electron Microscopy of Nanostructured SemiConductor Materials. in Terlet, J Self, P., Henderson, M. & M Dayman (eds), 17th Australian Conference on Electron Microscopy. Adelaide, South Australia edn, vol. One, Australian Society for Electron Microscopy Inc., Adelaide, South Australia, pp. 86, Analytical Electron Microscopy of Nanostructured SemiConductor Materials, 1/01/02.

Analytical Electron Microscopy of Nanostructured SemiConductor Materials. / Suvorova, Alexandra ; Saunders, Martin.
17th Australian Conference on Electron Microscopy. ed. / Terlet; J. Self; P.; Henderson; M.; M. Dayman. Vol. One Adelaide, South Australia. ed. Adelaide, South Australia: Australian Society for Electron Microscopy Inc., 2002. p. 86.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - Analytical Electron Microscopy of Nanostructured SemiConductor Materials

AU - Suvorova, Alexandra

AU - Saunders, Martin

PY - 2002

Y1 - 2002

M3 - Conference paper

SN - 095804080X

VL - One

SP - 86

BT - 17th Australian Conference on Electron Microscopy

A2 - Terlet, null

A2 - Self, J.

A2 - P., null

A2 - Henderson, null

A2 - M., null

A2 - Dayman, M.

PB - Australian Society for Electron Microscopy Inc.

CY - Adelaide, South Australia

T2 - Analytical Electron Microscopy of Nanostructured SemiConductor Materials

Y2 - 1 January 2002

ER -