Abstract
We present an experimental demonstration of a novel, integrated readout approach for measuring the suspended height of micro-electro-mechanical systems (MEMS) structures. The approach is based on creating a resonant optical cavity between the suspended MEMS structure and the substrate that the MEMS structure is anchored to. The resulting interferometric effect causes modulation of an optical laser signal which is strongly dependent on the position of the MEMS device. © 2014 SPIE.
Original language | English |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Place of Publication | USA |
Publisher | SPIE |
Pages | 90832X |
Volume | 9083 |
ISBN (Print) | 9781628410204 |
DOIs | |
Publication status | Published - 2014 |
Event | Micro- and Nanotechnology Sensors, Systems, and Applications VI - USA, Baltimore, United States Duration: 5 May 2014 → 9 May 2014 Conference number: 106857 |
Conference
Conference | Micro- and Nanotechnology Sensors, Systems, and Applications VI |
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Abbreviated title | SPIE 9083 |
Country/Territory | United States |
City | Baltimore |
Period | 5/05/14 → 9/05/14 |