Advantages of high resolution, low kV field emission SEM in the study of surface features of naturally occurring microdiamonds

R.L. Trautmann, Brendan Griffin

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationAustralian Conference of Electron Microscopy - 13
Place of PublicationBrisbane
PublisherAustralian Society of Electron Microscopy Inc
Pages204
Publication statusPublished - 1994
EventAdvantages of high resolution, low kV field emission SEM in the study of surface features of naturally occurring microdiamonds -
Duration: 1 Jan 1994 → …

Conference

ConferenceAdvantages of high resolution, low kV field emission SEM in the study of surface features of naturally occurring microdiamonds
Period1/01/94 → …

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