Advances in Environmental Scanning Electron Microscopy: Semiconductor/Thin FILM Applications, Cathodoluminescence (CL) Spectroscopy, And Detector Quantum Efficiency (DQE) Comparisons

Brendan Griffin, J.R. Browne, D. Drouin, D. Scharf

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationMicroscopy and Microanalysis '99
EditorsG.W. Bailey, W.G. Jerome, S. McKernan, J.F. Mansfield, R.L. Price
Place of PublicationPortland, Oregon
PublisherMicroscopy Society of America
Pages278-279
Volume5
EditionPortland Oregon
Publication statusPublished - 1999
EventAdvances in Environmental Scanning Electron Microscopy: Semiconductor/Thin FILM Applications, Cathodoluminescence (CL) Spectroscopy, And Detector Quantum Efficiency (DQE) Comparisons - Portland Oregon
Duration: 1 Jan 1999 → …

Conference

ConferenceAdvances in Environmental Scanning Electron Microscopy: Semiconductor/Thin FILM Applications, Cathodoluminescence (CL) Spectroscopy, And Detector Quantum Efficiency (DQE) Comparisons
Period1/01/99 → …

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