Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique

Michael Tobar; Gemma Hamilton; John Hartnett; Eugene Ivanov; D. Cros; P. Guillon

Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique

Michael Tobar, Gemma Hamilton, John Hartnett, Eugene Ivanov, D. Cros, P. Guillon

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea
Editors	R.J. Vig
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	365-370
Volume	N/A
Edition	Florida, USA
ISBN (Print)	0780376889
Publication status	Published - 2003
Event	Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique - Florida, USA Duration: 1 Jan 2003 → …

Conference

Conference	Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique
Period	1/01/03 → …

Cite this

Tobar, M., Hamilton, G., Hartnett, J., Ivanov, E., Cros, D., & Guillon, P. (2003). Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique. In R. J. Vig (Ed.), Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea (Florida, USA ed., Vol. N/A, pp. 365-370). IEEE, Institute of Electrical and Electronics Engineers.

Tobar, Michael ; Hamilton, Gemma ; Hartnett, John et al. / Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique. Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea. editor / R.J. Vig. Vol. N/A Florida, USA. ed. USA : IEEE, Institute of Electrical and Electronics Engineers, 2003. pp. 365-370

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title = "Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique",

author = "Michael Tobar and Gemma Hamilton and John Hartnett and Eugene Ivanov and D. Cros and P. Guillon",

year = "2003",

language = "English",

isbn = "0780376889",

volume = "N/A",

pages = "365--370",

editor = "R.J. Vig",

booktitle = "Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "Florida, USA",

note = "Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique ; Conference date: 01-01-2003",

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Tobar, M, Hamilton, G, Hartnett, J, Ivanov, E, Cros, D & Guillon, P 2003, Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique. in RJ Vig (ed.), Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea. Florida, USA edn, vol. N/A, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 365-370, Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique, 1/01/03.

Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique. / Tobar, Michael; Hamilton, Gemma; Hartnett, John et al.
Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea. ed. / R.J. Vig. Vol. N/A Florida, USA. ed. USA: IEEE, Institute of Electrical and Electronics Engineers, 2003. p. 365-370.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique

AU - Tobar, Michael

AU - Hamilton, Gemma

AU - Hartnett, John

AU - Ivanov, Eugene

AU - Cros, D.

AU - Guillon, P.

PY - 2003

Y1 - 2003

M3 - Conference paper

SN - 0780376889

VL - N/A

SP - 365

EP - 370

BT - Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea

A2 - Vig, R.J.

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique

Y2 - 1 January 2003

ER -

Tobar M, Hamilton G, Hartnett J, Ivanov E, Cros D, Guillon P. Accurate Characterization of the Temperature Coefficient of Permittivity of Sapphire Utilizing the Dual-Mode Frequency Locked Technique. In Vig RJ, editor, Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea. Florida, USA ed. Vol. N/A. USA: IEEE, Institute of Electrical and Electronics Engineers. 2003. p. 365-370