A study of FIB irradiation damage by low voltage microanalysis

T.C. Baroni, Brendan Griffin, F.J. Lincoln

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationSecond Conference of the International Union of Microbeam Analysis Societies
EditorsD.B. Williams, R. Shimizu
Place of PublicationUK
PublisherInstitute of Physics Publishing
Pages255-256
Volume165
EditionKailua-Kona, Hawaii
ISBN (Print)0 7503 0685 8
Publication statusPublished - 2000
EventA study of FIB irradiation damage by low voltage microanalysis - Kailua-Kona, Hawaii
Duration: 1 Jan 2000 → …

Conference

ConferenceA study of FIB irradiation damage by low voltage microanalysis
Period1/01/00 → …

Cite this

Baroni, T. C., Griffin, B., & Lincoln, F. J. (2000). A study of FIB irradiation damage by low voltage microanalysis. In D. B. Williams, & R. Shimizu (Eds.), Second Conference of the International Union of Microbeam Analysis Societies (Kailua-Kona, Hawaii ed., Vol. 165, pp. 255-256). Institute of Physics Publishing.