A study of FIB irradiation damage by low voltage microanalysis

T.C. Baroni; Brendan Griffin; F.J. Lincoln

A study of FIB irradiation damage by low voltage microanalysis

T.C. Baroni, Brendan Griffin, F.J. Lincoln

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Second Conference of the International Union of Microbeam Analysis Societies
Editors	D.B. Williams, R. Shimizu
Place of Publication	UK
Publisher	Institute of Physics Publishing
Pages	255-256
Volume	165
Edition	Kailua-Kona, Hawaii
ISBN (Print)	0 7503 0685 8
Publication status	Published - 2000
Event	A study of FIB irradiation damage by low voltage microanalysis - Kailua-Kona, Hawaii Duration: 1 Jan 2000 → …

Conference

Conference	A study of FIB irradiation damage by low voltage microanalysis
Period	1/01/00 → …

Cite this

@inproceedings{db03fa1cb4d94d63bf65660818d21d72,

title = "A study of FIB irradiation damage by low voltage microanalysis",

author = "T.C. Baroni and Brendan Griffin and F.J. Lincoln",

year = "2000",

language = "English",

isbn = "0 7503 0685 8",

volume = "165",

pages = "255--256",

editor = "D.B. Williams and R. Shimizu",

booktitle = "Second Conference of the International Union of Microbeam Analysis Societies",

publisher = "Institute of Physics Publishing",

address = "United States",

edition = "Kailua-Kona, Hawaii",

note = "A study of FIB irradiation damage by low voltage microanalysis ; Conference date: 01-01-2000",

}

Baroni, TC, Griffin, B & Lincoln, FJ 2000, A study of FIB irradiation damage by low voltage microanalysis. in DB Williams & R Shimizu (eds), Second Conference of the International Union of Microbeam Analysis Societies. Kailua-Kona, Hawaii edn, vol. 165, Institute of Physics Publishing, UK, pp. 255-256, A study of FIB irradiation damage by low voltage microanalysis, 1/01/00.

A study of FIB irradiation damage by low voltage microanalysis. / Baroni, T.C.; Griffin, Brendan; Lincoln, F.J.
Second Conference of the International Union of Microbeam Analysis Societies. ed. / D.B. Williams; R. Shimizu. Vol. 165 Kailua-Kona, Hawaii. ed. UK: Institute of Physics Publishing, 2000. p. 255-256.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - A study of FIB irradiation damage by low voltage microanalysis

AU - Baroni, T.C.

AU - Griffin, Brendan

AU - Lincoln, F.J.

PY - 2000

Y1 - 2000

M3 - Conference paper

SN - 0 7503 0685 8

VL - 165

SP - 255

EP - 256

BT - Second Conference of the International Union of Microbeam Analysis Societies

A2 - Williams, D.B.

A2 - Shimizu, R.

PB - Institute of Physics Publishing

CY - UK

T2 - A study of FIB irradiation damage by low voltage microanalysis

Y2 - 1 January 2000

ER -