A simplified method of electron microscope voltage measurement

J. D. Fitz Gerald, A. W. S. Johnson

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A simple, rapid procedure for the determination of the accelerating voltage of a transmission electron microscope is described, which involves the measurement of the ratio of two easily found distances in the Kikuchi pattern near the [111] zone of a silicon crystal. Using enlarged prints the accuracy of voltage determination is around 0.2%, and in good conditions, direct viewing of the flourescent screen gives an accuracy of better than 1%. Data are given for 5% variation from nominal voltages of 100, 120, and 200 kV.

Original languageEnglish
Pages (from-to)231-236
Number of pages6
JournalUltramicroscopy
Volume12
Issue number3
DOIs
Publication statusPublished - 1984
Externally publishedYes

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