A Simple Method for Evaluating Flaw Distributions Responsible for Size Effects in the Strength of Small-Scale Silicon Specimens

K. Duan, Xiao Hu

Research output: Contribution to journalArticle

3 Citations (Scopus)

Fingerprint Dive into the research topics of 'A Simple Method for Evaluating Flaw Distributions Responsible for Size Effects in the Strength of Small-Scale Silicon Specimens'. Together they form a unique fingerprint.

Engineering & Materials Science