A Simple Method for Evaluating Flaw Distributions Responsible for Size Effects in the Strength of Small-Scale Silicon Specimens

K. Duan, Xiao Hu

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A simple means of deconvoluting the size distributions of fracture-controlling flaws from Weibull strength plots for small-scale specimens is proposed. The method makes use a power-law distribution function, empirical in form but self-consistent with a conventional two-parameter Weibull probability distribution. Literature data for single-crystal silicon beam specimens covering a range of widths from mm to nm are analyzed according to this procedure. The analysis indicates a reduction in scatter in addition to increase in strength with diminishing specimen size, and quantifies a systematic tightening in flaw distribution associated with refinement in fabrication method.
Original languageEnglish
Pages (from-to)77-82
JournalKey Engineering Materials
Volume312
DOIs
Publication statusPublished - 2006

Fingerprint Dive into the research topics of 'A Simple Method for Evaluating Flaw Distributions Responsible for Size Effects in the Strength of Small-Scale Silicon Specimens'. Together they form a unique fingerprint.

  • Cite this