| Original language | English |
|---|---|
| Pages (from-to) | 2486-2487 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 25 |
| Issue number | S2 |
| DOIs | |
| Publication status | Published - Aug 2019 |
Equipment
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FEI Helios Nanolab G3 CX DualBeam FIB-SEM
Centre for Microscopy, Characterisation & AnalysisFacility/equipment: Equipment
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FEI Titan G2 80-200 TEM/STEM
Centre for Microscopy, Characterisation & AnalysisFacility/equipment: Equipment