Original language | English |
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Pages (from-to) | 2486-2487 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 25 |
Issue number | S2 |
DOIs | |
Publication status | Published - Aug 2019 |
Equipment
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FEI Helios Nanolab G3 CX DualBeam FIB-SEM
Centre for Microscopy, Characterisation & AnalysisFacility/equipment: Equipment
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FEI Titan G2 80-200 TEM/STEM
Centre for Microscopy, Characterisation & AnalysisFacility/equipment: Equipment